Search Within Electronics
ASTM F1190-93 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Publisher: ASTM International
Year: 1999
ASTM F364-96 - Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Publisher: ASTM International
Year: 1996
ASTM F3-99 - Standard Specification for Nickel Strip for Electron Tubes
Publisher: ASTM International
Year: 2002
ASTM F533-96 - Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
Publisher: ASTM International
Year: 2002
ASTM F576-00 - Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry
Publisher: ASTM International
Year: 2001
ASTM F928-93(1999) - Standard Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates
Publisher: ASTM International
Year: 2002
ASTM F951-01 - Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
Publisher: ASTM International
Year: 2002
ASTM F1724-96 - Standard Test Method for Measuring Surface Metal Contamination of Polycrystalline Silicon by Acid Extraction-Atomic Absorption Spectroscopy
Publisher: ASTM International
Year: 2001
ASTM F1597-01 - Standard Test Method for Determining the Actuation Force and Contact Force of a Membrane Switch
Publisher: ASTM International
Year: 2002
ASTM F1597-00 - Standard Test Method for Determining the Actuation Force and Contact Force of a Membrane Switch
Publisher: ASTM International
Year: 2002
ASTM F81-00 - Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers
Publisher: ASTM International
Year: 2001
ASTM F1578-00 - Standard Practice for Contact Closure Cycling of a Membrane Switch
Publisher: ASTM International
Year: 2001
ASTM F1152-93(2001) - Standard Test Method for Dimensions of Notches on Silicon Wafers
Publisher: ASTM International
Year: 2002
ASTM F2072-00 - Standard Practice for Hosedown of a Membrane Switch
Publisher: ASTM International
Year: 2001
ASTM F2073-00 - Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Publisher: ASTM International
Year: 2001
ASTM F951-96 - Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers
Publisher: ASTM International
Year: 2002
ASTM F1762-97 - Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
Publisher: ASTM International
Year: 2002
ASTM F534-97 - Standard Test Method for Bow of Silicon Wafers
Publisher: ASTM International
Year: 2002
ASTM F672-88(1995)e1 - Standard Test Method for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe
Publisher: ASTM International
Year: 2001
ASTM F1570-94 - Standard Test Method for Determining the Tactile Ratio of a Membrane Switch
Publisher: ASTM International
Year: 2001
ASTM F1239-94 - Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction
Publisher: ASTM International
Year: 2002
ASTM F978-90(1996)e1 - Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques
Publisher: ASTM International
Year: 2001
ASTM E2222-02 - Standard Practice for Host Computer Communication with Spectrometers for Color Measurements
Publisher: ASTM International
Year: 2002
ASTM F1174-91(1995) - Standard Practice for Using a Personal Computer Printer as a Test Instrument
Publisher: ASTM International
Year: 2001
ASTM F1618-02 - Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1527-02 - Standard Guide for Application of Certified Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM C749-92(2002) - Standard Test Method for Tensile Stress-Strain of Carbon and Graphite
Publisher: ASTM International
Year: 1992
ASTM F542-02 - Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation
Publisher: ASTM International
Year: 2002
ASTM B187/B187M-02 - Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Publisher: ASTM International
Year: 2002
ASTM E1855-96 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Publisher: ASTM International
Year: 1996
ASTM F28-02 - Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F42-02 - Standard Test Methods for Conductivity Type of Extrinsic Semiconducting Materials (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F84-02 - Standard Test Method for Measuring Resistivity of Silicon Wafers With an In-Line Four-Point Probe (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F374-02 - Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F391-02 - Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F397-02 - Standard Test Method for Resistivity of Silicon Bars Using a Two-Point Probe (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F523-02 - Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F533-02a - Standard Test Method for Thickness and Thickness Variation of Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F534-02a - Standard Test Method for Bow of Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F847-02 - Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F950-02 - Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1049-02 - Standard Practice for Shallow Etch Pit Detection on Silicon Wafers (Withdrawn 2003
Publisher: ASTM International
Year: 2002
ASTM F1393-02 - Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1529-02 - Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure
Publisher: ASTM International
Year: 2002
ASTM F1725-02 - Standard Guide for Analysis of Crystallographic Perfection of Silicon Ingots (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1726-02 - Standard Guide for Analyis of Crystallographic Perfection of Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1727-02 - Standard Practice for Detection of Oxidation Induced Defects in Polished Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1809-02 - Standard Guide for Selection and Use of Etching Solutions to Delineate Structural Defects in Silicon (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1812-02 - Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Publisher: ASTM International
Year: 2002
ASTM F1842-02 - Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications
Publisher: ASTM International
Year: 2002
ASTM F2114-02 - Standard Guide for ASTM Standard Test Methods, Standard Practices, and Typical Values of a Membrane Switch (Withdrawn 2009)
Publisher: ASTM International
Year: 2002
ASTM F2218-02 - Standard Guide for Hardware Implementation for Computerized Systems
Publisher: ASTM International
Year: 2002
ASTM F3-02a - Standard Specification for Nickel Strip for Electron Tubes (Withdrawn 2008)
Publisher: ASTM International
Year: 2002
ASTM F673-02 - Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1392-02 - Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1390-02 - Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1843-97(2002) - Standard Practice for Sample Preparation of Transparent Plastic Films for Specular Gloss Measurements, on Membrane Switch Overlays
Publisher: ASTM International
Year: 1997
ASTM F398-92(2002) - Standard Test Method for Majority Carrier Concentration in Semiconductors by Measurement of Wavenumber or Wavelength of the Plasma Resonance Minimum (Withdrawn 2003)
Publisher: ASTM International
Year: 1992
ASTM F1153-92(2002) - Standard Test Method for Characterization of Metal-Oxide-Silicon (MOS) Structures by Capacitance-Voltage Measurements (Withdrawn 2003)
Publisher: ASTM International
Year: 1992
ASTM F1188-02 - Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption with Short Baseline (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1366-92(2002) - Standard Test Method for Measuring Oxygen Concentration in Heavily Doped Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
Publisher: ASTM International
Year: 1991
ASTM F1530-02 - Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1771-97(2002) - Standard Test Method for Evaluating Gate Oxide Integrity by Voltage Ramp Technique (Withdrawn 2003)
Publisher: ASTM International
Year: 1997
ASTM F1810-97(2002) - Standard Test Method for Counting Preferentially Etched or Decorated Surface Defects in Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 1997
ASTM F29-97(2002) - Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Publisher: ASTM International
Year: 1997
ASTM B187/B187M-03 - Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Publisher: ASTM International
Year: 2003
ASTM F78-97(2002) - Standard Test Method for Calibration of Helium Leak Detectors by Use of Secondary Standards (Withdrawn 2008)
Publisher: ASTM International
Year: 2002
ASTM F85-76(2002) - Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Publisher: ASTM International
Year: 2002
ASTM F357-78(2002) - Standard Practice for Determining Solderability of Thick Film Conductors (Withdrawn 2008)
Publisher: ASTM International
Year: 2002
ASTM F508-77(2002) - Standard Practice for Specifying Thick-Film Pastes (Withdrawn 2008)
Publisher: ASTM International
Year: 2002
ASTM F1711-96(2002) - Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe
Publisher: ASTM International
Year: 2002
ASTM F1844-97(2002) - Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
Publisher: ASTM International
Year: 2002
ASTM F1845-97(2002) - Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Reduction Glow Discharge Mass Spectrometer
Publisher: ASTM International
Year: 2002
ASTM F798-97(2002) - Standard Practice for Determining Gettering Rate, Sorption Capacity, and Gas Content of Nonevaporable Getters in the Molecular Flow Region (Withdrawn 2008)
Publisher: ASTM International
Year: 2002
ASTM F1262M-95(2002) - Standard Guide for Transient Radiation Upset Threshold of Digital Integrated Circuits
Publisher: ASTM International
Year: 2002
ASTM F1709-97(2002) - Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Publisher: ASTM International
Year: 2002
ASTM F97-72(2002)e1 - Standard Practices for Determining Hermeticity of Electron Devices by Dye Penetration (Withdrawn 2008)
Publisher: ASTM International
Year: 2002
ASTM B888-03 - Standard Specification for Copper Alloy Strip for Use in the Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2003
ASTM D3380-90(2003) - Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Publisher: ASTM International
Year: 2003
ASTM B885-97(2003) - Standard Test Method for Presence of Foreign Matter on Printed Wiring Board Contacts
Publisher: ASTM International
Year: 2003
ASTM E1854-03 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Publisher: ASTM International
Year: 2003
ASTM B738-03 - Standard Specification for Fine-Wire Bunch-Stranded and Rope-Lay Bunch-Stranded Copper Conductors for Use as Electrical Conductors
Publisher: ASTM International
Year: 2003
ASTM F1364-03 - Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Publisher: ASTM International
Year: 2003
ASTM F1944-98(2003) - Standard Practice for Determining the Quality of the Text, Line- and Solid-Fill Output Produced by Ink Jet Printers
Publisher: ASTM International
Year: 1998
ASTM F1238-95(2003) - Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
Publisher: ASTM International
Year: 1999
ASTM F1893-98(2003) - Guide for Measurement of Ionizing Dose-Rate Burnout of Semiconductor Devices
Publisher: ASTM International
Year: 1998
ASTM F1894-98(2003) - Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
Publisher: ASTM International
Year: 1998
ASTM F1-03 - Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes (Withdrawn 2009)
Publisher: ASTM International
Year: 2003
ASTM F1513-99(2003) - Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
Publisher: ASTM International
Year: 1999
ASTM F2357-04 - Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader
Publisher: ASTM International
Year: 2004
ASTM B49-98(2004) - Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Publisher: ASTM International
Year: 2004
ASTM F2359-04 - Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
Publisher: ASTM International
Year: 2004
ASTM F2360-04 - Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
Publisher: ASTM International
Year: 2004
ASTM F1895-98(2004) - Practice for Submersion of a Membrane Switch
Publisher: ASTM International
Year: 2004
ASTM F1896-98(2004) - Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Publisher: ASTM International
Year: 2004
ASTM E1606-99(2004)e1 - Standard Practice for Electromagnetic (Eddy-Current) Examination of Copper Redraw Rod for Electrical Purposes
Publisher: ASTM International
Year: 2004
ASTM B888-04 - Standard Specification for Copper Alloy Strip for Use in the Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2004
ASTM E986-04 - Standard Practice for Scanning Electron Microscope Beam Size Characterization
Publisher: ASTM International
Year: 2004
ASTM F1892-04 - Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Publisher: ASTM International
Year: 2004
ASTM E722-04 - Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Publisher: ASTM International
Year: 2004
ASTM E1855-04 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Publisher: ASTM International
Year: 2004
ASTM D1867-01 - Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring
Publisher: ASTM International
Year: 2001
ASTM D4496-04 - Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
Publisher: ASTM International
Year: 2004
ASTM D5109-99(2004) - Standard Test Methods for Copper-Clad Thermosetting Laminates for Printed Wiring Boards
Publisher: ASTM International
Year: 1999
ASTM F375-89(2005) - Standard Specification for Integrated Circuit Lead Frame Material
Publisher: ASTM International
Year: 2004
ASTM F448-99(2005) - Test Method for Measuring Steady-State Primary Photocurrent
Publisher: ASTM International
Year: 2004
ASTM F528-99(2005) - Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors (Withdrawn 2011)
Publisher: ASTM International
Year: 1999
ASTM F1263-99(2005) - Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Publisher: ASTM International
Year: 1999
ASTM F1467-99(2005) - Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Publisher: ASTM International
Year: 2004
ASTM F1997-99(2005) - Standard Test Method for Determining the Sensitivity (Teasing) of a Tactile Membrane Switch
Publisher: ASTM International
Year: 1999
ASTM E1250-88(2005) - Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Publisher: ASTM International
Year: 2004
ASTM F1190-99(2005) - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Publisher: ASTM International
Year: 2004
ASTM D4196-05 - Standard Test Method for Confirming the Sterility of Membrane Filters
Publisher: ASTM International
Year: 2004
ASTM E722-04e1 - Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Publisher: ASTM International
Year: 2004
ASTM B354-05 - Standard Terminology Relating to Uninsulated Metallic Electrical Conductors
Publisher: ASTM International
Year: 2005
ASTM D6095-05 - Standard Test Method for Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Publisher: ASTM International
Year: 2005
ASTM E1362-05 - Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells
Publisher: ASTM International
Year: 2005
ASTM F1595-00(2005) - Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
Publisher: ASTM International
Year: 2005
ASTM F1596-00(2005) - Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity
Publisher: ASTM International
Year: 2005
ASTM F1995-00(2005) - Standard Test Method for Determining the Bond Strength for a Surface Mount Device (SMD) by Applying Shear Force on a Membrane Switch
Publisher: ASTM International
Year: 2005
ASTM E2444-05 - Terminology Relating to Measurements Taken on Thin, Reflecting Films
Publisher: ASTM International
Year: 2005
ASTM E1854-05 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Publisher: ASTM International
Year: 2005
ASTM E668-05 - Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Publisher: ASTM International
Year: 2005
ASTM E1855-04e1 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Publisher: ASTM International
Year: 2004
ASTM E977-05 - Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Publisher: ASTM International
Year: 2005
ASTM E1855-05 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Publisher: ASTM International
Year: 2005
ASTM E1855-05e1 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Publisher: ASTM International
Year: 2005
ASTM D3004-02 - Standard Specification for Extruded Crosslinked and Thermoplastic Semi-Conducting, Conductor and Insulation Shielding Materials
Publisher: ASTM International
Year: 2002
ASTM B896-99(2005) - Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Publisher: ASTM International
Year: 2005
ASTM F1812-97a - Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Publisher: ASTM International
Year: 1997
ASTM F18-64(2006) - Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Publisher: ASTM International
Year: 2005
ASTM E2444-05e1 - Terminology Relating to Measurements Taken on Thin, Reflecting Films
Publisher: ASTM International
Year: 2005
ASTM F1221-89(2006) - Standard Guide for Interagency Information Exchange
Publisher: ASTM International
Year: 2006
ASTM B888-06 - Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2006
ASTM D6095-06 - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Publisher: ASTM International
Year: 2006
ASTM F1364-03e1 - Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Publisher: ASTM International
Year: 2006
ASTM D4496-04e1 - Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials (Withdrawn 2013)
Publisher: ASTM International
Year: 2004
ASTM E1574-98(2006) - Standard Test Method for Measurement of Sound in Residential Spaces
Publisher: ASTM International
Year: 2006
ASTM D5138-06 - Standard Classification System for Liquid Crystal Polymers (LCP)
Publisher: ASTM International
Year: 2006
ASTM F1174-01(2006) - Standard Practice for Using a Personal Computer Printer as a Test Instrument
Publisher: ASTM International
Year: 2006
ASTM F1192-00(2006) - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Publisher: ASTM International
Year: 2006
ASTM F2073-01(2006) - Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Publisher: ASTM International
Year: 2006
ASTM F1892-06 - Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Publisher: ASTM International
Year: 2006
ASTM B187/B187M-06 - Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Publisher: ASTM International
Year: 2006
ASTM D5071-06 - Standard Practice for Exposure of Photodegradable Plastics in a Xenon Arc Apparatus
Publisher: ASTM International
Year: 2006
ASTM E1438-06 - Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Publisher: ASTM International
Year: 2006
ASTM D3862-80(2001) - Standard Test Method for Retention Characteristics of 0.2-µm Membrane Filters Used in Routine Filtration Procedures for the Evaluation of Microbiological Water Quality (Withdrawn 2010)
Publisher: ASTM International
Year: 2000
ASTM B373-00(2006) - Standard Specification for Aluminum Foil for Capacitors (Withdrawn 2015)
Publisher: ASTM International
Year: 2006
ASTM E427-95(2006) - Standard Practice for Testing for Leaks Using the Halogen Leak Detector(Alkali-Ion Diode) (Withdrawn 2013)
Publisher: ASTM International
Year: 2006
ASTM F1598-95(2007) - Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
Publisher: ASTM International
Year: 2007
ASTM F2072-01(2007) - Standard Practice for Hosedown of a Membrane Switch
Publisher: ASTM International
Year: 2007
ASTM F640-07 - Standard Test Methods for Determining Radiopacity for Medical Use
Publisher: ASTM International
Year: 2007
ASTM E722-04e2 - Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Publisher: ASTM International
Year: 2005
ASTM D4196-82(1998) - Standard Test Method for Confirming the Sterility of Membrane Filters
Publisher: ASTM International
Year: 1998
ASTM E2222-02(2007) - Standard Practice for Host Computer Communication with Spectrometers for Color Measurements (Withdrawn 2012)
Publisher: ASTM International
Year: 2007
ASTM B542-07 - Standard Terminology Relating to Electrical Contacts and Their Use
Publisher: ASTM International
Year: 2007
ASTM F542-07 - Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation (Withdrawn 2013)
Publisher: ASTM International
Year: 2007
ASTM D1867-07 - Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring
Publisher: ASTM International
Year: 2007
ASTM B84-07 - Standard Test Method for Temperature-Resistance Constants of Alloy Wires for Precision Resistors
Publisher: ASTM International
Year: 2007
ASTM B267-07 - Standard Specification for Wire for Use In Wire-Wound Resistors
Publisher: ASTM International
Year: 2007
ASTM E431-96(2007) - Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Publisher: ASTM International
Year: 2007
ASTM E1854-07 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Publisher: ASTM International
Year: 2007
ASTM F2113-01(2007) - Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
Publisher: ASTM International
Year: 2007
ASTM D4496-87(1998)e1 - Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
Publisher: ASTM International
Year: 1997
ASTM F1578-07 - Standard Test Method for Contact Closure Cycling of a Membrane Switch
Publisher: ASTM International
Year: 2007
ASTM F1596-07 - Standard Test Method for Exposure of Membrane Switches to Temperature and Relative Humidity
Publisher: ASTM International
Year: 2007
ASTM F1762-07 - Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
Publisher: ASTM International
Year: 2007
ASTM F1404-92(2007) - Test Method for Crystallographic Perfection of Gallium Arsenide by Molten Potassium Hydroxide (KOH) Etch Technique (Withdrawn 2016)
Publisher: ASTM International
Year: 2007
ASTM B888-08 - Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2008
ASTM B49-08 - Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Publisher: ASTM International
Year: 2008
ASTM B738-03(2008) - Standard Specification for Fine-Wire Bunch-Stranded and Rope-Lay Bunch-Stranded Copper Conductors for Use as Electrical Conductors
Publisher: ASTM International
Year: 2008
ASTM D3004-08 - Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
Publisher: ASTM International
Year: 2008
ASTM D5071-99 - Standard Practice for Exposure of Photodegradable Plastics in a Xenon Arc Apparatus
Publisher: ASTM International
Year: 1999
ASTM F2218-02(2008) - Standard Guide for Hardware Implementation for Computerized Systems
Publisher: ASTM International
Year: 2008
ASTM D5109-99 - Standard Test Methods for Copper-Clad Thermosetting Laminates for Printed Wiring Boards
Publisher: ASTM International
Year: 1999
ASTM F615M-95(2008) - Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
Publisher: ASTM International
Year: 2008
ASTM F1709-97(2008) - Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Publisher: ASTM International
Year: 2008
ASTM F1711-96(2008) - Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
Publisher: ASTM International
Year: 2008
ASTM F1944-98(2008) - Standard Practice for Determining the Quality of the Text, Line- and Solid-Fill Output Produced by Ink Jet Printers (Withdrawn 2016)
Publisher: ASTM International
Year: 2008
ASTM D5138-99a - Standard Specification for Liquid Crystal Polymers
Publisher: ASTM International
Year: 1999
ASTM F1844-97(2008) - Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
Publisher: ASTM International
Year: 2008
ASTM F76-08 - Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Publisher: ASTM International
Year: 2008
ASTM F1845-08 - Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
Publisher: ASTM International
Year: 2008
ASTM F1709-97 - Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Publisher: ASTM International
Year: 1995
ASTM F2360-08 - Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
Publisher: ASTM International
Year: 2008
ASTM B49-08a - Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Publisher: ASTM International
Year: 2008
ASTM B885-09 - Standard Test Method for Presence of Foreign Matter on Printed Wiring Board Contacts
Publisher: ASTM International
Year: 2009
ASTM F29-97(2009) - Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Publisher: ASTM International
Year: 2009
ASTM F83-71(2009) - Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Publisher: ASTM International
Year: 2009
ASTM F85-76(2009) - Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Publisher: ASTM International
Year: 2009
ASTM F364-96(2009) - Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Publisher: ASTM International
Year: 2009
ASTM E1606-09 - Standard Practice for Electromagnetic (Eddy-Current) Examination of Copper Redraw Rod for Electrical Purposes
Publisher: ASTM International
Year: 2004
ASTM B682-01(2009) - Standard Specification for Standard Metric Sizes of Electrical Conductors
Publisher: ASTM International
Year: 2009
ASTM E1161-09 - Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
Publisher: ASTM International
Year: 2009
ASTM F1842-09 - Standard Test Method for Determining Ink or Coating Adhesion on Plastic Substrates for Membrane Switch Applications
Publisher: ASTM International
Year: 2009
ASTM F1843-09 - Standard Practice for Sample Preparation of Transparent Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
Publisher: ASTM International
Year: 2009
ASTM E722-09 - Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Publisher: ASTM International
Year: 2009
ASTM F1812-09 - Standard Test Method for Determining the Effectiveness of Membrane Switch ESD Shielding
Publisher: ASTM International
Year: 2009
ASTM E722-09e1 - Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Publisher: ASTM International
Year: 2009
ASTM B634-88(2009) - Standard Specification for Electrodeposited Coatings of Rhodium for Engineering Use
Publisher: ASTM International
Year: 2009
ASTM B679-98(2009) - Standard Specification for Electrodeposited Coatings of Palladium for Engineering Use
Publisher: ASTM International
Year: 2009
ASTM B888-09 - Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2009
ASTM B49-09 - Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Publisher: ASTM International
Year: 2009
ASTM E427-95(2000) - Standard Practice for Testing for Leaks Using the Halogen Leak Detector (Alkali-Ion Diode)
Publisher: ASTM International
Year: 2000
ASTM E431-96(2002) - Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Publisher: ASTM International
Year: 1996
ASTM F677-04(2009) - Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Publisher: ASTM International
Year: 2009
ASTM D3380-10 - Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Publisher: ASTM International
Year: 2009
ASTM F1364-03(2010) - Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Publisher: ASTM International
Year: 2010
ASTM B888-10 - Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2010
ASTM E986-04(2010) - Standard Practice for Scanning Electron Microscope Beam Size Characterization
Publisher: ASTM International
Year: 2010
ASTM F1895-10 - Practice for Submersion of a Membrane Switch
Publisher: ASTM International
Year: 2010
ASTM F1896-10 - Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Publisher: ASTM International
Year: 2010
ASTM F2357-10 - Standard Test Method for Determining the Abrasion Resistance of Inks and Coatings on Membrane Switches Using the Norman Tool "RCA" Abrader (Withdrawn 2017)
Publisher: ASTM International
Year: 2010
ASTM E1362-10 - Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells
Publisher: ASTM International
Year: 2009
ASTM E668-00 - Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Publisher: ASTM International
Year: 2000
ASTM E668-10 - Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Publisher: ASTM International
Year: 2010
ASTM B896-10 - Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Publisher: ASTM International
Year: 2010
ASTM E722-94(2002) - Standard Practice for Characterizing Neutron Energy Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Publisher: ASTM International
Year: 1994
ASTM E1855-10 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Publisher: ASTM International
Year: 2010
ASTM E977-05(2010) - Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Publisher: ASTM International
Year: 2010
ASTM B49-10 - Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Publisher: ASTM International
Year: 2010
ASTM F375-89(2010) - Standard Specification for Integrated Circuit Lead Frame Material
Publisher: ASTM International
Year: 2010
ASTM B896-10e1 - Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Publisher: ASTM International
Year: 2010
ASTM F1895-10a - Practice for Submersion of a Membrane Switch
Publisher: ASTM International
Year: 2010
ASTM E1250-10 - Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Publisher: ASTM International
Year: 2010
ASTM F980-10 - Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Publisher: ASTM International
Year: 1996
ASTM F1467-99(2005)e1 - Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Publisher: ASTM International
Year: 2004
ASTM F996-11 - Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Publisher: ASTM International
Year: 2010
ASTM F2866-10 - Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
Publisher: ASTM International
Year: 2010
ASTM F1893-11 - Guide for Measurement of Ionizing Dose-Rate Survivability and Burnout of Semiconductor Devices
Publisher: ASTM International
Year: 2010
ASTM B187/B187M-11 - Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Publisher: ASTM International
Year: 2011
ASTM D4196-05(2011) - Standard Test Method for Confirming the Sterility of Membrane Filters
Publisher: ASTM International
Year: 2011
ASTM E977-84(1999) - Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Publisher: ASTM International
Year: 1999
ASTM E986-97 - Standard Practice for Scanning Electron Microscope Beam Size Characterization
Publisher: ASTM International
Year: 1997
ASTM F448-11 - Test Method for Measuring Steady-State Primary Photocurrent
Publisher: ASTM International
Year: 2011
ASTM F1263-11 - Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Publisher: ASTM International
Year: 2011
ASTM F1238-95(2011) - Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications (Withdrawn 2020)
Publisher: ASTM International
Year: 2011
ASTM F1513-99(2011) - Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications (Withdrawn 2020)
Publisher: ASTM International
Year: 2011
ASTM F1894-98(2011) - Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness (Withdrawn 2020)
Publisher: ASTM International
Year: 2011
ASTM F2113-01(2011) - Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications (Withdrawn 2020)
Publisher: ASTM International
Year: 2011
ASTM G166-00(2011) - Standard Guide for Statistical Analysis of Service Life Data
Publisher: ASTM International
Year: 2011
ASTM F2866-11 - Standard Test Method for Flammability of a Membrane Switch in Defined Assembly
Publisher: ASTM International
Year: 2011
ASTM F2865-11 - Standard Guide for Classifying the Degrees of Ingression Protection Provided by a Membrane Switch
Publisher: ASTM International
Year: 2011
ASTM F2359-04(2011) - Standard Test Method for Determining Color of a Membrane Switch Backlit with Diffuse Light Source
Publisher: ASTM International
Year: 2011
ASTM D5138-11 - Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP)
Publisher: ASTM International
Year: 2011
ASTM F1467-11 - Standard Guide for Use of an X-Ray Tester (≈10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Publisher: ASTM International
Year: 2011
ASTM F1190-11 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Publisher: ASTM International
Year: 2011
ASTM F1192-11 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Publisher: ASTM International
Year: 2011
ASTM E1438-11 - Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Publisher: ASTM International
Year: 2011
ASTM E2444-11 - Terminology Relating to Measurements Taken on Thin, Reflecting Films
Publisher: ASTM International
Year: 2011
ASTM E1161-95 - Standard Test Method for Radiologic Examination of Semiconductors and Electronic Components
Publisher: ASTM International
Year: 1994
ASTM E1250-88(2000) - Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Publisher: ASTM International
Year: 2000
ASTM B49-98e2 - Standard Specification for Copper Rod Drawing Stock for Electrical Purposes
Publisher: ASTM International
Year: 1998
ASTM F1595-00(2012) - Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
Publisher: ASTM International
Year: 2012
ASTM E431-96(2011) - Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Publisher: ASTM International
Year: 2011
ASTM F18-12 - Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Publisher: ASTM International
Year: 2012
ASTM F1995-12 - Standard Test Method for Determining the Shear Force of a Surface Mount Device (SMD) in a Membrane Switch
Publisher: ASTM International
Year: 2012
ASTM E1362-99 - Standard Test Method for Calibration of Non-Concentrator Photovoltaic Secondary Reference Cells
Publisher: ASTM International
Year: 1999
ASTM F2964-12 - Standard Test Method for Determining the Uniformity of the Luminance of an Electroluminescent Lamp or Other Diffuse Lighting Device
Publisher: ASTM International
Year: 2012
ASTM F29-97(2012) - Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Publisher: ASTM International
Year: 2012
ASTM E2444-11e1 - Terminology Relating to Measurements Taken on Thin, Reflecting Films
Publisher: ASTM International
Year: 2011
ASTM B84-90(2001) - Standard Test Method for Temperature-Resistance Constants of Alloy Wires for Precision Resistors
Publisher: ASTM International
Year: 2000
ASTM B984-12 - Standard Specification for Electrodeposited Coatings of Palladium- Cobalt Alloy for Engineering Use
Publisher: ASTM International
Year: 2012
ASTM F1892-12 - Standard Guide for Ionizing Radiation (Total Dose) Effects Testing of Semiconductor Devices
Publisher: ASTM International
Year: 2012
ASTM E1438-91(2001) - Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
Publisher: ASTM International
Year: 1991
ASTM E1467-94(2000) - Standard Specification for Transferring Digital Neurophysiological Data Between Independent Computer Systems (Withdrawn 2004)
Publisher: ASTM International
Year: 1999
ASTM B888-12 - Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2012
ASTM D5109-12 - Standard Test Methods for Copper-Clad Thermosetting Laminates for Printed Wiring Boards (Withdrawn 2020)
Publisher: ASTM International
Year: 2012
ASTM D6095-12 - Standard Test Method for Longitudinal Measurement of Volume Resistivity for Extruded Crosslinked and Thermoplastic Semiconducting Conductor and Insulation Shielding Materials
Publisher: ASTM International
Year: 2012
ASTM F1174-12 - Standard Practice for Using a Personal Computer Printer as a Test Instrument
Publisher: ASTM International
Year: 2012
ASTM B193-87(1992) - Standard Test Method for Resistivity of Electrical Conductor Materials
Publisher: ASTM International
ASTM F640-12 - Standard Test Methods for Determining Radiopacity for Medical Use
Publisher: ASTM International
Year: 2012
ASTM F2865-13 - Standard Guide for Classifying the Degrees of Ingress of Dust and Water into a Membrane Switch
Publisher: ASTM International
Year: 2012
ASTM E1606-99 - Standard Practice for Electromagnetic (Eddy-Current) Examination of Copper Redraw Rod for Electrical Purposes
Publisher: ASTM International
Year: 1999
ASTM B354-12 - Standard Terminology Relating to Uninsulated Metallic Electrical Conductors
Publisher: ASTM International
Year: 2012
ASTM E668-13 - Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices
Publisher: ASTM International
Year: 2012
ASTM B542-13 - Standard Terminology Relating to Electrical Contacts and Their Use
Publisher: ASTM International
Year: 2013
ASTM D5071-06(2013) - Standard Practice for Exposure of Photodegradable Plastics in a Xenon Arc Apparatus
Publisher: ASTM International
Year: 2013
ASTM E1713-95 - Standard Specification for Transferring Digital Waveform Data Between Independent Computer Systems (Withdrawn 2004)
Publisher: ASTM International
Year: 1994
ASTM B738-13 - Standard Specification for Fine-Wire Bunch-Stranded and Rope-Lay Bunch-Stranded Copper Conductors for Use as Electrical Conductors
Publisher: ASTM International
Year: 2013
ASTM F677-13 - Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications (Withdrawn 2013)
Publisher: ASTM International
Year: 2013
ASTM B84-07(2013) - Standard Test Method for Temperature-Resistance Constants of Alloy Wires for Precision Resistors
Publisher: ASTM International
Year: 2013
ASTM B267-07(2013) - Standard Specification for Wire for Use In Wire-Wound Resistors
Publisher: ASTM International
Year: 2013
ASTM F83-71(2013) - Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Publisher: ASTM International
Year: 2013
ASTM F85-76(2013) - Standard Practice for Nomenclature for Wire Leads Used as Conductors in Electron Tubes
Publisher: ASTM International
Year: 2013
ASTM F615M-95(2013) - Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
Publisher: ASTM International
Year: 2013
ASTM F1995-13 - Standard Test Method for Determining the Shear Strength of the Bond between a Surface Mount Device (SMD) and Substrate in a Membrane Switch
Publisher: ASTM International
Year: 2013
ASTM F1-94(2000) - Standard Specification for Nickel-Clad and Nickel-Plated Steel Strip for Electron Tubes
Publisher: ASTM International
Year: 2000
ASTM F3-02 - Standard Specification for Nickel Strip for Electron Tubes
Publisher: ASTM International
Year: 2002
ASTM D4496-13 - Standard Test Method for D-C Resistance or Conductance of Moderately Conductive Materials
Publisher: ASTM International
Year: 2013
ASTM F18-64(2000) - Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Publisher: ASTM International
Year: 1999
ASTM E1854-13 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Publisher: ASTM International
Year: 2013
ASTM F26-87a(1999) - Standard Test Methods for Determining the Orientation of a Semiconductive Single Crystal (Withdrawn 2003)
Publisher: ASTM International
Year: 1998
ASTM F28-91(1997) - Standard Test Methods for Minority-Carrier Lifetime in Bulk Germanium and Silicon by Measurement of Photoconductivity Decay
Publisher: ASTM International
Year: 1997
ASTM F43-99 - Standard Test Methods for Resistivity of Semiconductor Materials (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F71-68(1999) - Standard Practice for Using the Morphological Key for the Rapid Identification of Fibers for Contamination Control in Electron Devices and Microelectronics (Withdrawn 2005)
Publisher: ASTM International
Year: 1999
ASTM F76-86(2002) - Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Publisher: ASTM International
Year: 1986
ASTM D3862-13 - Standard Test Method for Retention Characteristics of 0.2-µm Membrane Filters Used in Routine Filtration Procedures for the Evaluation of Microbiological Water Quality
Publisher: ASTM International
Year: 2013
ASTM F77-69(1996) - Test Method for Apparent Density of Ceramics for Electron Device and Semiconductor Application (Withdrawn 2001)
Publisher: ASTM International
Year: 1995
ASTM F81-01 - Standard Test Method for Measuring Radial Resistivity Variation on Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2001
ASTM F83-71(2002) - Standard Practice for Definition and Determination of Thermionic Constants of Electron Emitters
Publisher: ASTM International
Year: 1971
ASTM F95-89(2000) - Standard Test Method for Thickness of Lightly Doped Silicon Epitaxial Layers on Heavily Doped Silicon Substrates Using an Infrared Dispersive Spectrophotometer (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F110-00a - Standard Test Method for Thickness of Epitaxial or Diffused Layers in Silicon by the Angle Lapping and Staining Technique (Withdrawn 2003)
Publisher: ASTM International
Year: 2000
ASTM F111-96(2002) - Standard Practice for Determining Barium Yield, Getter Gas Content, and Getter Sorption Capacity for Barium Flash Getters (Withdrawn 2008)
Publisher: ASTM International
Year: 1996
ASTM E1854-96 - Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
Publisher: ASTM International
Year: 1996
ASTM B888/B888M-13 - Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2013
ASTM F358-83(2002) - Standard Test Method for Wavelength of Peak Photoluminescence and the Corresponding Composition of Gallium Arsenide Phosphide Wafers (Withdrawn 2008)
Publisher: ASTM International
Year: 1983
ASTM F364-96(2002) - Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Publisher: ASTM International
Year: 1996
ASTM F374-00a - Standard Test Method for Sheet Resistance of Silicon Epitaxial, Diffused, Polysilicon, and Ion-implanted Layers Using an In-Line Four-Point Probe with the Single-Configuration Procedure
Publisher: ASTM International
Year: 2000
ASTM D1867-13 - Standard Specification for Copper-Clad Thermosetting Laminates for Printed Wiring (Withdrawn 2020)
Publisher: ASTM International
Year: 2013
ASTM F375-89(1999) - Standard Specification for Integrated Circuit Lead Frame Material
Publisher: ASTM International
Year: 1998
ASTM F391-96 - Standard Test Methods for Minority Carrier Diffusion Length in Extrinsic Semiconductors by Measurement of Steady-State Surface Photovoltage
Publisher: ASTM International
Year: 1995
ASTM F399-00a - Standard Test Method for Thickness of Heteroepitaxial or Polysilicon Layers (Withdrawn 2002)
Publisher: ASTM International
Year: 2000
ASTM F418-77(2002) - Standard Practice for Preparation of Samples of the Constant Composition Region of Epitaxial Gallium Arsenide Phosphide for Hall Effect Measurements (Withdrawn 2008)
Publisher: ASTM International
Year: 1977
ASTM D3004-08(2013) - Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
Publisher: ASTM International
Year: 2013
ASTM F419-94 - Test Method for Determining Carrier Density in Silicon Epitaxial Layers by Capacitance-Voltage Measurements on Fabricated Junction or Schottky Diodes (Withdrawn 2001)
Publisher: ASTM International
Year: 1993
ASTM F1762-14 - Standard Test Method for Determining the Effects of Atmospheric Pressure Variation on a Membrane Switch
Publisher: ASTM International
Year: 2013
ASTM F1895-14 - Standard Test Method for Submersion of a Membrane Switch
Publisher: ASTM International
Year: 2013
ASTM F2072-14 - Standard Test Method for Hosedown of a Membrane Switch
Publisher: ASTM International
Year: 2013
ASTM E1574-98(2014) - Standard Test Method for Measurement of Sound in Residential Spaces
Publisher: ASTM International
Year: 2014
ASTM F523-93(1997) - Standard Practice for Unaided Visual Inspection of Polished Silicon Wafer Surfaces
Publisher: ASTM International
Year: 1997
ASTM F524-77(1992) - Test Methods for Measuring Beam Divergence of Pulsed Lasers by the Apertured-Detector Technique (Withdrawn 2001)
Publisher: ASTM International
Year: 1991
ASTM F525-00a - Standard Test Method for Measuring Resistivity of Silicon Wafers Using a Spreading Resistance Probe (Withdrawn 2003)
Publisher: ASTM International
Year: 2000
ASTM F528-99 - Standard Test Method of Measurement of Common-Emitter D-C Current Gain of Junction Transistors
Publisher: ASTM International
Year: 1999
ASTM B193-02(2014) - Standard Test Method for Resistivity of Electrical Conductor Materials
Publisher: ASTM International
Year: 2014
ASTM F533-02 - Standard Test Method for Thickness and Thickness Variation of Silicon Wafers
Publisher: ASTM International
Year: 2002
ASTM F534-02 - Standard Test Method for Bow of Silicon Wafers
Publisher: ASTM International
Year: 2002
ASTM F542-98 - Standard Test Method for Exothermic Temperature of Encapsulating Compounds for Electronic and Microelectronic Encapsulation
Publisher: ASTM International
Year: 1998
ASTM C346-87(2014) - Standard Test Method for 45-deg Specular Gloss of Ceramic Materials
Publisher: ASTM International
Year: 2014
ASTM F576-01 - Standard Test Method for Measurement of Insulator Thickness and Refractive Index on Silicon Substrates by Ellipsometry (Withdrawn 2003)
Publisher: ASTM International
Year: 2001
ASTM F1578-07(2014) - Standard Test Method for Contact Closure Cycling of a Membrane Switch
Publisher: ASTM International
Year: 2014
ASTM F1221-89(2014) - Standard Guide for Interagency Information Exchange
Publisher: ASTM International
Year: 2014
ASTM E977-05(2014) - Standard Practice for Thermoelectric Sorting of Electrically Conductive Materials
Publisher: ASTM International
Year: 2014
ASTM E1161-09(2014) - Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
Publisher: ASTM International
Year: 2014
ASTM F364-96(2014) - Standard Specification for Molybdenum Flattened Wire for Electron Tubes
Publisher: ASTM International
Year: 2014
ASTM F1598-95(2014) - Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
Publisher: ASTM International
Year: 2014
ASTM F615M-95 - Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components [Metric]
Publisher: ASTM International
Year: 1995
ASTM F616-92 - Standard Test Method for Measuring MOSFET Drain Leakage Current
Publisher: ASTM International
Year: 1991
ASTM F617-00 - Standard Test Method for Measuring MOSFET Linear Threshold Voltage (Withdrawn 2006)
Publisher: ASTM International
Year: 2000
ASTM F3080-14 - Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector and CCTV Camera System
Publisher: ASTM International
Year: 2014
ASTM F640-79(2000) - Standard Test Methods for Radiopacity of Plastics for Medical Use
Publisher: ASTM International
Year: 1999
ASTM F3095-14 - Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
Publisher: ASTM International
Year: 2014
ASTM F657-92(1999) - Standard Test Method for Measuring Warp and Total Thickness Variation on Silicon Wafers by Noncontact Scanning (Withdrawn 2003)
Publisher: ASTM International
Year: 1998
ASTM B634-14 - Standard Specification for Electrodeposited Coatings of Rhodium for Engineering Use
Publisher: ASTM International
Year: 2014
ASTM F671-99 - Standard Test Method for Measuring Flat Length on Wafers of Silicon and Other Electronic Materials (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F672-01 - Standard Test Method for Measuring Resistivity Profiles Perpendicular to the Surface of a Silicon Wafer Using a Spreading Resistance Probe (Withdrawn 2003)
Publisher: ASTM International
Year: 2001
ASTM F673-90(1996)e1 - Standard Test Methods for Measuring Resistivity of Semiconductor Slices or Sheet Resistance of Semiconductor Films with a Noncontact Eddy-Current Gage
Publisher: ASTM International
Year: 1995
ASTM F674-92(1999) - Standard Practice for Preparing Silicon for Spreading Resistance Measurements (Withdrawn 2003)
Publisher: ASTM International
Year: 1998
ASTM F676-97 - Standard Test Method for Measuring Unsaturated TTL Sink Current
Publisher: ASTM International
Year: 1992
ASTM F677-95(1999) - Standard Test Method for Fluid and Grease Resistance of Thermoset Encapsulating Compounds Used in Electronic and Microelectronic Applications
Publisher: ASTM International
Year: 1999
ASTM F980-10e1 - Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Publisher: ASTM International
Year: 2010
ASTM E722-14 - Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics
Publisher: ASTM International
Year: 2014
ASTM F723-99 - Standard Practice for Conversion Between Resistivity and Dopant Density for Boron-Doped, Phosphorus-Doped, and Arsenic-Doped Silicon (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F2073-14 - Standard Test Method for Non-Destructive Short Circuit Testing of a Membrane Switch
Publisher: ASTM International
Year: 2014
ASTM B187-00e1 - Standard Specification for Copper Bar, Bus Bar, Rod, and Shapes
Publisher: ASTM International
Year: 2000
ASTM D3380-14 - Standard Test Method for Relative Permittivity (Dielectric Constant) and Dissipation Factor of Polymer-Based Microwave Circuit Substrates
Publisher: ASTM International
Year: 2014
ASTM B634-14a - Standard Specification for Electrodeposited Coatings of Rhodium for Engineering Use
Publisher: ASTM International
Year: 2014
ASTM F744M-97 - Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits
Publisher: ASTM International
Year: 1996
ASTM F773-92 - Practice for Measuring Dose Rate Response of Linear Integrated Circuits
Publisher: ASTM International
Year: 1991
ASTM B193-02 - Standard Test Method for Resistivity of Electrical Conductor Materials
Publisher: ASTM International
Year: 2002
ASTM F815-88(1993)e1 - Test Method for Detection of Epitaxial Spikes (Withdrawn 1999)
Publisher: ASTM International
Year: 1992
ASTM F816-83(1998)e1 - Standard Test Method for Combined Fine and Gross Leaks for Large Hybrid Microcircuit Packages
Publisher: ASTM International
Year: 1998
ASTM F847-94(1999) - Standard Test Methods for Measuring Crystallographic Orientation of Flats on Single Crystal Silicon Wafers by X-Ray Techniques
Publisher: ASTM International
Year: 1998
ASTM B885-09(2015) - Standard Test Method for Presence of Foreign Matter on Printed Wiring Board Contacts
Publisher: ASTM International
Year: 2015
ASTM F928-02 - Standard Test Methods for Edge Contour of Circular Semiconductor Wafers and Rigid Disk Substrates (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM B49-15 - Standard Specification for Copper Rod for Electrical Purposes
Publisher: ASTM International
Year: 2015
ASTM F1762-02 - Standard Practice for Exposing a Membrane Switch to Variation in Atmospheric Pressure
Publisher: ASTM International
Year: 2002
ASTM F950-98 - Standard Test Method for Measuring the Depth of Crystal Damage of a Mechanically Worked Silicon Slice Surface by Angle Polishing and Defect Etching
Publisher: ASTM International
Year: 1998
ASTM F951-02 - Standard Test Method for Determination of Radial Interstitial Oxygen Variation in Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM B187/B187M-15 - Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Publisher: ASTM International
Year: 2015
ASTM F978-02 - Standard Test Method for Characterizing Semiconductor Deep Levels by Transient Capacitance Techniques (Withdrawn 2003)
Publisher: ASTM International
Year: 2001
ASTM F980-92 - Guide for The Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Publisher: ASTM International
Year: 1991
ASTM F2218-02(2015) - Standard Guide for Hardware Implementation for Computerized Systems
Publisher: ASTM International
Year: 2015
ASTM F2360-08(2015)e1 - Standard Test Method for Determining Luminance of a Membrane Switch Backlit with Diffuse Light Source
Publisher: ASTM International
Year: 2015
ASTM F996-98 - Standard Test Method for Separating an Ionizing Radiation-Induced MOSFET Threshold Voltage Shift Into Components Due to Oxide Trapped Holes and Interface States Using the Subthreshold Current-Voltage Characteristics
Publisher: ASTM International
Year: 1998
ASTM E1250-15 - Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices
Publisher: ASTM International
Year: 2015
ASTM F1843-15 - Standard Practice for Sample Preparation of Plastic Films used on Membrane Switch Overlays for Specular Gloss Measurements
Publisher: ASTM International
Year: 2015
ASTM F1842-15 - Standard Test Method for Determining Ink or Coating Adhesion on Flexible Substrates for a Membrane Switch or Printed Electronic Device
Publisher: ASTM International
Year: 2015
ASTM F3147-15 - Standard Test Method for Evaluating the Reliability of Surface Mounted Device (SMD) Joints on a Flexible Circuit by a Rolling Mandrel Bend
Publisher: ASTM International
Year: 2015
ASTM F1812-15 - Standard Test Method for Determining the Effect of an ESD Discharge on a Membrane Switch or Printed Electronic Device
Publisher: ASTM International
Year: 2015
ASTM F1596-15 - Standard Test Method for Exposure of a Membrane Switch or Printed Electronic Device to Temperature and Relative Humidity
Publisher: ASTM International
Year: 2015
ASTM F3152-15 - Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Norman Tool “WA-1010 Wet Abrader”
Publisher: ASTM International
Year: 2015
ASTM F1049-00 - Standard Practice for Shallow Etch Pit Detection on Silicon Wafers
Publisher: ASTM International
Year: 2000
ASTM E3022-15 - Standard Practice for Measurement of Emission Characteristics and Requirements for LED UV-A Lamps Used in Fluorescent Penetrant and Magnetic Particle Testing
Publisher: ASTM International
Year: 2015
ASTM F1364-03(2015) - Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Publisher: ASTM International
Year: 2015
ASTM F375-89(2015) - Standard Specification for Integrated Circuit Lead Frame Material
Publisher: ASTM International
Year: 2015
ASTM B896-10(2015) - Standard Test Methods for Evaluating Connectability Characteristics of Electrical Conductor Materials
Publisher: ASTM International
Year: 2015
ASTM B49-15a - Standard Specification for Copper Rod for Electrical Purposes
Publisher: ASTM International
Year: 2015
ASTM E1855-15 - Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors
Publisher: ASTM International
Year: 2015
ASTM B682-01(2009)e1 - Standard Specification for Standard Metric Sizes of Electrical Conductors
Publisher: ASTM International
Year: 2009
ASTM B679-98(2015) - Standard Specification for Electrodeposited Coatings of Palladium for Engineering Use
Publisher: ASTM International
Year: 2015
ASTM F1152-02 - Standard Test Method for Dimensions of Notches on Silicon Wafers (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM E1606-15 - Standard Practice for Electromagnetic (Eddy Current) Examination of Copper and Aluminum Redraw Rod for Electrical Purposes
Publisher: ASTM International
Year: 2015
ASTM F1174-01 - Standard Practice for Using a Personal Computer Printer as a Test Instrument
Publisher: ASTM International
Year: 2001
ASTM E1362-15 - Standard Test Methods for Calibration of Non-Concentrator Photovoltaic Non-Primary Reference Cells
Publisher: ASTM International
Year: 2015
ASTM F1188-00 - Standard Test Method for Interstitial Atomic Oxygen Content of Silicon by Infrared Absorption
Publisher: ASTM International
Year: 2000
ASTM F1190-99 - Standard Guide for Neutron Irradiation of Unbiased Electronic Components
Publisher: ASTM International
Year: 1999
ASTM F1192-00 - Standard Guide for the Measurement of Single Event Phenomena (SEP) Induced by Heavy Ion Irradiation of Semiconductor Devices
Publisher: ASTM International
Year: 2000
ASTM F1211-89(2001) - Standard Specification for Semiconductor Device Passivation Opening Layouts (Withdrawn 2007)
Publisher: ASTM International
Year: 2000
ASTM F1212-89(2002) - Standard Test Method for Thermal Stability Testing of Gallium Arsenide Wafers (Withdrawn 2008)
Publisher: ASTM International
Year: 1989
ASTM F1221-89(2001) - Standard Guide for Interagency Information Exchange
Publisher: ASTM International
Year: 2000
ASTM D5138-16 - Standard Classification System and Basis for Specification for Liquid Crystal Polymers Molding and Extrusion Materials (LCP)
Publisher: ASTM International
Year: 2016
ASTM F1238-95(1999) - Standard Specification for Refractory Silicide Sputtering Targets for Microelectronic Applications
Publisher: ASTM International
Year: 1999
ASTM F1239-02 - Standard Test Methods for Oxygen Precipitation Characterization of Silicon Wafers by Measurement of Interstitial Oxygen Reduction (Withdrawn 2003)
Publisher: ASTM International
Year: 2002
ASTM F1241-95(2000) - Standard Terminology of Silicon Technology (Withdrawn 2003)
Publisher: ASTM International
Year: 2000
ASTM B193-16 - Standard Test Method for Resistivity of Electrical Conductor Materials
Publisher: ASTM International
Year: 2016
ASTM F1259-89 - Guide for Design of Flat, Straight-Line Test Structures for Detecting Metallization Open-Circuit or Resistance-Increase Failure Due to Electromigration
Publisher: ASTM International
Year: 1988
ASTM F1260-89 - Test Method for Estimating Electromigration Median Time-To-Failure and Sigma of Integrated Circuit Metallizations
Publisher: ASTM International
Year: 1988
ASTM F1261M-96 - Standard Test Method for Determining the Average Electrical Width of a Straight, Thin-Film Metal Line [Metric]
Publisher: ASTM International
Year: 1995
ASTM F1263-99 - Standard Guide for Analysis of Overtest Data in Radiation Testing of Electronic Parts
Publisher: ASTM International
Year: 1999
ASTM B576-94(2016) - Standard Guide for Arc Erosion Testing of Electrical Contact Materials
Publisher: ASTM International
Year: 2016
ASTM F76-08(2016) - Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Publisher: ASTM International
Year: 2016
ASTM F1709-97(2016) - Standard Specification for High Purity Titanium Sputtering Targets for Electronic Thin Film Applications
Publisher: ASTM International
Year: 2016
ASTM F1844-97(2016) - Standard Practice for Measuring Sheet Resistance of Thin Film Conductors For Flat Panel Display Manufacturing Using a Noncontact Eddy Current Gage
Publisher: ASTM International
Year: 2016
ASTM F1845-08(2016) - Standard Test Method for Trace Metallic Impurities in Electronic Grade Aluminum-Copper, Aluminum-Silicon, and Aluminum-Copper-Silicon Alloys by High-Mass-Resolution Glow Discharge Mass Spectrometer
Publisher: ASTM International
Year: 2016
ASTM F1896-16 - Test Method for Determining the Electrical Resistivity of a Printed Conductive Material
Publisher: ASTM International
Year: 2016
ASTM F3152-16 - Standard Test Method for Determining Abrasion Resistance of Inks and Coatings on Substrates Using Dry or Wet Abrasive Medium
Publisher: ASTM International
Year: 2016
ASTM F744M-16 - Standard Test Method for Measuring Dose Rate Threshold for Upset of Digital Integrated Circuits (Metric)
Publisher: ASTM International
Year: 2016
ASTM B49-16 - Standard Specification for Copper Rod for Electrical Purposes
Publisher: ASTM International
Year: 2016
ASTM F1711-96(2016) - Standard Practice for Measuring Sheet Resistance of Thin Film Conductors for Flat Panel Display Manufacturing Using a Four-Point Probe Method
Publisher: ASTM International
Year: 2016
ASTM F773M-16 - Standard Practice for Measuring Dose Rate Response of Linear Integrated Circuits (Metric)
Publisher: ASTM International
Year: 2016
ASTM B187/B187M-16 - Standard Specification for Copper, Bus Bar, Rod, and Shapes and General Purpose Rod, Bar, and Shapes
Publisher: ASTM International
Year: 2016
ASTM E431-96(2016) - Standard Guide to Interpretation of Radiographs of Semiconductors and Related Devices
Publisher: ASTM International
Year: 2016
ASTM F1364-92(1997)e1 - Standard Practice for Use of a Calibration Device to Demonstrate the Inspection Capability of an Interferometric Laser Imaging Nondestructive Tire Inspection System
Publisher: ASTM International
Year: 1997
ASTM B354-16 - Standard Terminology Relating to Uninsulated Metallic Electrical Conductors
Publisher: ASTM International
Year: 2016
ASTM F1388-92(2000) - Standard Test Method for Generation Lifetime and Generation Velocity of Silicon Material by Capacitance-Time Measurements of Metal-Oxide-Silicon (MOS) Capacitors (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F1389-00 - Standard Test Methods for Photoluminescence Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)
Publisher: ASTM International
Year: 2000
ASTM F1390-97 - Standard Test Method for Measuring Warp on Silicon Wafers by Automated Noncontact Scanning
Publisher: ASTM International
Year: 1997
ASTM F1391-93(2000) - Standard Test Method for Substitutional Atomic Carbon Content of Silicon by Infrared Absorption (Withdrawn 2003)
Publisher: ASTM International
Year: 2000
ASTM F1392-00 - Standard Test Method for Determining Net Carrier Density Profiles in Silicon Wafers by Capacitance-Voltage Measurements With a Mercury Probe
Publisher: ASTM International
Year: 2000
ASTM F1393-92(1997) - Standard Test Method for Determining Net Carrier Density in Silicon Wafers by Miller Feedback Profiler Measurements With a Mercury Probe
Publisher: ASTM International
Year: 1991
ASTM B682-01(2016) - Standard Specification for Standard Metric Sizes of Electrical Conductors
Publisher: ASTM International
Year: 2016
ASTM B1004-16 - Standard Practice for Contact Performance Classification of Electrical Connection Systems
Publisher: ASTM International
Year: 2016
ASTM F1451-92(1999) - Standard Test Method for Measuring Sori on Silicon Wafers by Automated Noncontact Scanning (Withdrawn 2003)
Publisher: ASTM International
Year: 1998
ASTM F1467-99 - Standard Guide for Use of an X-Ray Tester ([approximate]10 keV Photons) in Ionizing Radiation Effects Testing of Semiconductor Devices and Microcircuits
Publisher: ASTM International
Year: 1999
ASTM B267-90(2001) - Standard Specification for Wire for Use In Wire-Wound Resistors
Publisher: ASTM International
Year: 2000
ASTM F980-16 - Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
Publisher: ASTM International
Year: 2016
ASTM F1513-99 - Standard Specification for Pure Aluminum (Unalloyed) Source Material for Electronic Thin Film Applications
Publisher: ASTM International
Year: 1999
ASTM F1526-95(2000) - Standard Test Method for Measuring Surface Metal Contamination on Silicon Wafers by Total Reflection X-Ray Fluorescence Spectroscopy (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F1527-00 - Standard Guide for Application of Silicon Standard Reference Materials and Reference Wafers for Calibration and Control of Instruments for Measuring Resistivity of Silicon
Publisher: ASTM International
Year: 2000
ASTM F1528-94(1999) - Standard Test Method for Measuring Boron Contamination in Heavily Doped N-Type Silicon Substrates by Secondary Ion Mass Spectrometry (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F1529-97 - Standard Test Method for Sheet Resistance Uniformity Evaluation by In-Line Four-Point Probe with the Dual-Configuration Procedure (Withdrawn 2003)
Publisher: ASTM International
Year: 1997
ASTM F1530-94 - Standard Test Method for Measuring Flatness, Thickness, and Thickness Variation on Silicon Wafers by Automated Noncontact Scanning
Publisher: ASTM International
Year: 1993
ASTM F1535-00 - Standard Test Method for Carrier Recombination Lifetime in Silicon Wafers by Noncontact Measurement of Photoconductivity Decay by Microwave Reflectance (Withdrawn 2003)
Publisher: ASTM International
Year: 2000
ASTM B888/B888M-17 - Standard Specification for Copper Alloy Strip for Use in Manufacture of Electrical Connectors or Spring Contacts
Publisher: ASTM International
Year: 2017
ASTM B49-17 - Standard Specification for Copper Rod for Electrical Purposes
Publisher: ASTM International
Year: 2017
ASTM F1569-94(1999) - Standard Guide for Generation of Consensus Reference Materials for Semiconductor Technology (Withdrawn 2003)
Publisher: ASTM International
Year: 1999
ASTM F1570-01e1 - Standard Test Method for Determining the Tactile Ratio of a Membrane Switch (Withdrawn 2007)
Publisher: ASTM International
Year: 2001
ASTM F76-08(2016)e1 - Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
Publisher: ASTM International
Year: 2016
ASTM F1578-01 - Standard Practice for Contact Closure Cycling of a Membrane Switch
Publisher: ASTM International
Year: 2001
ASTM F3080-17 - Standard Practice for Laser Technologies for Measurement of Cross-Sectional Shape of Pipeline and Conduit by Non-Rotating Laser Projector and CCTV Camera System
Publisher: ASTM International
Year: 2017
ASTM F3095-17 - Standard Practice for Laser Technologies for Direct Measurement of Cross Sectional Shape of Pipeline and Conduit by Rotating Laser Diodes and CCTV Camera System
Publisher: ASTM International
Year: 2017
ASTM F18-12(2017) - Standard Specification and Test Method for Evaluation of Glass-to-Metal Headers Used in Electron Devices
Publisher: ASTM International
Year: 2017
ASTM F29-97(2017) - Standard Specification for Dumet Wire for Glass-to-Metal Seal Applications
Publisher: ASTM International
Year: 2017
ASTM E986-04(2017) - Standard Practice for Scanning Electron Microscope Beam Size Characterization
Publisher: ASTM International
Year: 2017
ASTM F1595-00 - Standard Practice for Viewing Conditions for Visual Inspection of Membrane Switches
Publisher: ASTM International
Year: 2000
ASTM F1596-00 - Standard Practice for Exposure of Membrane Switches to Temperature and Relative Humidity
Publisher: ASTM International
Year: 2000
ASTM F1598-95(2002) - Standard Test Method for Determining the Effects of Chemical/Solvent Exposure to a Membrane Switch/Graphic Overlay (Spot Test Method)
Publisher: ASTM International
Year: 1995
ASTM F1618-96 - Standard Practice for Determination of Uniformity of Thin Films on Silicon Wafers
Publisher: ASTM International
Year: 1995
ASTM F1619-95(2000)e1 - Standard Test Method for Measurement of Interstitial Oxygen Content of Silicon Wafers by Infrared Absorption Spectroscopy with p-Polarized Radiation Incident at the Brewster Angle (Withdrawn 2003)
Publisher: ASTM International
Year: 1995
ASTM F1620-96 - Standard Practice for Calibrating a Scanning Surface Inspection System Using Monodisperse Polystyrene Latex Spheres Deposited on Polished or Epitaxial Wafer Surfaces (Withdrawn 2003)
Publisher: ASTM International
Year: 1995
ASTM F1621-96 - Standard Practice for Determining the Positional Accuracy Capabilities of a Scanning Surface Inspection System (Withdrawn 2003)
Publisher: ASTM International
Year: 1995
ASTM F1630-00 - Standard Test Method for Low Temperature FT-IR Analysis of Single Crystal Silicon for III-V Impurities (Withdrawn 2003)
Publisher: ASTM International
Year: 2000
ASTM F3259-17 - Standard Guide for Micro-computed Tomography of Tissue Engineered Scaffolds
Publisher: ASTM International
Year: 2017
IEC 60238:1967 - Edison screw lampholders
Publisher: IEC - International Electrotechnical Commission
Year: 1966
IEC 60238:1967/AMD1:1972 - Amendment 1 - Edison screw lampholders
Publisher: IEC - International Electrotechnical Commission
Year: 1972
IEC 60234:1967 - Dimensions of ceramic dielectric capacitors of the plate type.
Publisher: IEC - International Electrotechnical Commission
Year: 1966
IEC 60234A:1970 - First supplement - Dimensions of ceramic dielectric capacitors of the plate type
Publisher: IEC - International Electrotechnical Commission
Year: 1969
IEC 60235-1:1967 - Measurement of the electrical properties of microwave tubes and valves - Part 1: General terms and definitions
Publisher: IEC - International Electrotechnical Commission
Year: 1966
IEC 60249-1:1968 - Metal-clad base materials for printed circuits - Part 1 : Test methods
Publisher: IEC - International Electrotechnical Commission
Year: 1967
IEC 60249-2-10:1987/AMD3:1993 - Amendment No. 3 - Base materials for printed circuits. Part 2: Specifications - Specification No. 10: Epoxide non-woven/woven glass reinforced copper-clad laminated sheet of defined flammability (vertical burning test)
Publisher: IEC - International Electrotechnical Commission
Year: 1993
IEC 60249-2-10:1987/AMD4:1994 - Amendment No. 4 - Base materials for printed circuits. Part 2: Specifications - Specification No. 10: Epoxide non-woven/woven glass reinforced copper-clad laminated sheet of defined flammability (vertical burning test)
Publisher: IEC - International Electrotechnical Commission
Year: 1994
IEC 60249-2-11:1987 - Base materials for printed circuits. Part 2: Specifications. Specification No. 11: Thin epoxide woven glass fabric copper-clad laminated sheet, general purpose grade for use in the fabrication of multilayer printed boards
Publisher: IEC - International Electrotechnical Commission
Year: 1987
IEC 60249-2-11:1987/AMD2:1993 - Amendment 2 - Base materials for printed circuits. Part 2: Specifications. Specification No. 11: Thin epoxide woven glass fabric copper-clad laminated sheet, general purpose grade for use in the fabrication of multilayer printed boards
Publisher: IEC - International Electrotechnical Commission
Year: 1993
IEC 60249-2-11:1987/AMD3:1994 - Amendment 3 - Base materials for printed circuits. Part 2: Specifications. Specification No. 11: Thin epoxide woven glass fabric copper-clad laminated sheet, general purpose grade for use in the fabrication of multilayer printed boards
Publisher: IEC - International Electrotechnical Commission
Year: 1994
IEC 60249-2-12:1987/AMD3:1994 - Amendment 3 - Base materials for printed circuits. Part 2: Specifications. Specification No. 12: Thin epoxide woven glass fabric copper-clad laminated sheet of defined flammability, for use in the fabrication of multilayer printed boards
Publisher: IEC - International Electrotechnical Commission
Year: 1994
IEC 60249-2-14:1988/AMD3:1993 - Amendment No. 3 - Base materials for printed circuits. Part 2:
Specifications. Specification No. 14: Phenolic cellulose paper
copper-clad laminated sheet of defined flammability (vertical
burning test), economic quality
Publisher: IEC - International Electrotechnical Commission
Year: 1993
IEC 60249-2-15:1987 - Base materials for printed circuits. Part 2: Specifications. Specification No. 15: Flexible copper-clad polyimide film, of defined flammability
Publisher: IEC - International Electrotechnical Commission
Year: 1987
IEC 60249-2-13:1987 - Base materials for printed circuits. Part 2: Specifications. Specification No. 13: Flexible copper-clad polyimide film, general purpose grade
Publisher: IEC - International Electrotechnical Commission
Year: 1987
IEC 60249-2-14:1988/AMD4:1994 - Amendment 4 - Base materials for printed circuits. Part 2:
Specifications. Specification No. 14: Phenolic cellulose paper
copper-clad laminated sheet of defined flammability (vertical
burning test), economic quality
Publisher: IEC - International Electrotechnical Commission
Year: 1994
IEC 60249-2-13:1987/AMD1:1993 - Amendment 1 - Base materials for printed circuits. Part 2: Specifications. Specification No. 13: Flexible copper-clad polyimide film, general purpose grade
Publisher: IEC - International Electrotechnical Commission
Year: 1993
IEC 60249-2-15:1987/AMD1:1993 - Amendment 1 - Base materials for printed circuits. Part 2: Specifications. Specification No. 15: Flexible copper-clad polyimide film, of defined flammability
Publisher: IEC - International Electrotechnical Commission
Year: 1993
IEC 60249-2-14:1988 - Base materials for printed circuits. Part 2: Specifications. Specification No. 14: Phenolic cellulose paper copper-clad laminated sheet of defined flammability (vertical burning test), economic quality
Publisher: IEC - International Electrotechnical Commission
Year: 1988
IEC 60249-2:1970 - Metal-clad base materials for printed circuits - Part 2: Specifications
Publisher: IEC - International Electrotechnical Commission
Year: 1969
IEC 60249-2-8:1987 - Base materials for printed circuits. Part 2: Specifications. Specification No. 8: Flexible copper-clad polyester (PETP) film
Publisher: IEC - International Electrotechnical Commission
Year: 1987
IEC 60249-2-8:1987/AMD1:1993 - Amendment 1 - Base materials for printed circuits. Part 2: Specifications. Specification No. 8: Flexible copper-clad polyester (PETP) film
Publisher: IEC - International Electrotechnical Commission
Year: 1993
IEC 60249-2-9:1987 - Base materials for printed circuits. Part 2: Specifications. Specification No. 9: Epoxide cellulose paper core, epoxide glass cloth surfaces copper-clad laminated sheet of defined flammability (vertical burning test)
Publisher: IEC - International Electrotechnical Commission
Year: 1987
IEC 60249-2-9:1987/AMD3:1993 - Amendment 3 - Base materials for printed circuits. Part 2:
Specifications. Specification No. 9: Epoxide cellulose paper core
epoxide glass cloth surfaces copper-clad laminated sheet of defined
flammability (vertical burning test)
Publisher: IEC - International Electrotechnical Commission
Year: 1993
IEC 60249-2-9:1987/AMD4:1994 - Amendment 4 - Base materials for printed circuits. Part 2:
Specifications. Specification No. 9: Epoxide cellulose paper core,
epoxide glass cloth surfaces copper-clad laminated sheet of defined
flammability (vertical burning test)
Publisher: IEC - International Electrotechnical Commission
Year: 1994
IEC 60249-2-10:1987 - Base materials for printed circuits. Part 2: Specifications. Specification No. 10: Epoxide non-woven/woven glass reinforced copper-clad laminated sheet of defined flammability (vertical burning test)
Publisher: IEC - International Electrotechnical Commission
Year: 1987
IEC 60601-2-22:1992 - Medical electrical equipment - Part 2: Particular requirements for the safety of diagnostic and therapeutic laser equipment
Publisher: IEC - International Electrotechnical Commission
Year: 1991
IEC 60603-10:1991 - Connectors for frequencies below 3 MHz for use with printed boards - Part 10: Two-part connectors for printed boards for basic grid of 2,54 mm (0,1 in), inverted type
Publisher: IEC - International Electrotechnical Commission
Year: 1991
IEC 60603-1:1981 - Connectors for frequencies below 3 MHz for use with printed boards - Part 1: General rules and guide for the preparation of detail specifications
Publisher: IEC - International Electrotechnical Commission
Year: 1980
IEC 60603-2:1980 - Connectors for frequencies below 3 MHz for use with printed boards - Part 2: Two-part connectors for printed boards, for basic grid of 2.54 mm (0.1 in), with common mounting
Publisher: IEC - International Electrotechnical Commission
Year: 1979
IEC 60603-7:1990 - Connectors for frequencies below 3 MHz for use with printed boards. Part 7: Detail specification for connectors, 8-way, including fixed and free connectors with common mating features.
Publisher: IEC - International Electrotechnical Commission
Year: 1990
IEC 60603-9:1990 - Connectors for frequencies below 3 MHz for use with printed boards. Part 9: Two-part connectors for printed boards, backpanels and cable connectors, basic grid of 2.54 mm (0.1 in)
Publisher: IEC - International Electrotechnical Commission
Year: 1990
IEC 60620:1978 - Dimensions for the mounting of single-hole, bush-mounted, spindle-operated, electronic components
Publisher: IEC - International Electrotechnical Commission
Year: 1977
IEC 60612:1978 - Guide to the use of variable capacitors in electronic equipment
Publisher: IEC - International Electrotechnical Commission
Year: 1977
IEC 60604:1980 - 'Topflash/Flipflash' photographic lamp array
Publisher: IEC - International Electrotechnical Commission
Year: 1979
IEC 60617-5:1983 - Graphical symbols for diagrams. Part 5: Semiconductors and electron tubes.
Publisher: IEC - International Electrotechnical Commission
Year: 1982