IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1620.1-2006

IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 8 November 2006
Status: active
Page(s): 1 - 16
ICS Code (Transistors): 31.080.30
ISBN (Online): 978-0-7381-5011-6
DOI: 10.1109/IEEESTD.2006.248144
Standard:

Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic... View More

Document History

1620.1-2006
November 8, 2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits,...
January 1, 2005
Unapproved IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (Superseded by Approved IEEE Draft)
A description is not available for this item.
January 1, 2005
IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
A description is not available for this item.
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