IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1620-2008

IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 5 December 2008
Status: active
Page(s): 1 - 26
ICS Code (Transistors): 31.080.30
ISBN (Online): 978-0-7381-6016-0
DOI: 10.1109/IEEEStd.2008.4696034
Regular:

Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics,... View More

Standard:

This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.... View More

Document History

1620-2008
December 5, 2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials
Recommended methods and standardized reporting practices for electrical characterization of printed and organic transistors are covered. Due to the nature of printed and organic electronics,...
December 5, 2008
IEEE Standard for Test Methods for the Characterization of Organic Transistors and Materials - Redline
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization....
January 1, 2008
IEEE Draft Standard for Test Methods for the Characterization of Organic Transistors and Materials
A description is not available for this item.
January 1, 2007
IEEE Draft Standard for Test Methods for the Characterization of Organic Transistors and Materials
A description is not available for this item.
April 29, 2004
Standard for Test Methods for the Characterization of Organic Transistors and Materials
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.
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