IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1620-2004
Standard for Test Methods for the Characterization of Organic Transistors and Materials
|Organization:||IEEE - Institute of Electrical and Electronics Engineers, Inc.|
|Publication Date:||29 April 2004|
|Page(s):||1 - 20|
|ICS Code (Transistors):||31.080.30|
This standard describes a method for characterizing organic electronic devices, including measurement techniques, methods of reporting data, and the testing conditions during characterization.