IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1620.1/D8

Unapproved IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (Superseded by Approved IEEE Draft)

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Status: inactive
ICS Code (Transistors): 31.080.30
ISBN (Electronic): 978-1-5044-3048-7

Document History

November 8, 2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits,...
P1620.1/D8
January 1, 2005
Unapproved IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (Superseded by Approved IEEE Draft)
A description is not available for this item.
January 1, 2005
IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
A description is not available for this item.
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