IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1620.1/D8, Jul 2005

IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2005
Status: inactive
ICS Code (Transistors): 31.080.30
ISBN (Electronic): 978-1-5044-3049-4

Document History

November 8, 2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits,...
January 1, 2005
Unapproved IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (Superseded by Approved IEEE Draft)
A description is not available for this item.
P1620.1/D8, Jul 2005
January 1, 2005
IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
A description is not available for this item.
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