IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1620.1/D8, Jul 2005
IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 January 2005 |
| Status: | inactive |
| ICS Code (Transistors): | 31.080.30 |
| ISBN (Electronic): | 978-1-5044-3049-4 |
Document History
November 8, 2006
IEEE Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
Recommended methods and standardized reporting practices for electricalcharacterization of printed and organic ring oscillators are covered. Due to the nature of printedand organic circuits,...
P1620.1/D8, Jul 2005
January 1, 2005
IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
A description is not available for this item.
January 1, 2005
Unapproved IEEE Draft Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (Superseded by Approved IEEE Draft)
A description is not available for this item.