IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1149.4-2010

IEEE Standard for a Mixed-Signal Test Bus

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 18 March 2011
Status: active
Page(s): 1 - 116
ICS Code (Printed circuits and boards): 31.180
ISBN (Online): 978-0-7381-6523-3
DOI: 10.1109/IEEESTD.2011.5738198
Regular:

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together... View More

Standard:

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together... View More

Document History

1149.4-2010
March 18, 2011
IEEE Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
P1149.4
October 7, 2010
IEEE Draft Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the...
P1149.4/D14, Apr 2009
January 1, 2009
Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
1149.4-1999
March 20, 2000
IEEE Standard for a Mixed-Signal Test Bus
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,...

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