IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1149.4/D14, Apr 2009

Standard for a Mixed-Signal Test Bus

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2009
Status: inactive
ICS Code (Printed circuits and boards): 31.180
ISBN (Electronic): 978-1-5044-2888-0
Standard:

The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together... View More

Document History

March 18, 2011
IEEE Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
October 7, 2010
IEEE Draft Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the...
P1149.4/D14, Apr 2009
January 1, 2009
Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
March 20, 2000
IEEE Standard for a Mixed-Signal Test Bus
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,...
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