IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1149.4
IEEE Draft Standard for a Mixed-Signal Test Bus
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 7 October 2010 |
Status: | inactive |
Page(s): | 1 - 113 |
ICS Code (Printed circuits and boards): | 31.180 |
ISBN (Online): | 978-0-7381-6441-0 |
Standard:
The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with... View More
Document History

March 18, 2011
IEEE Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...

P1149.4
October 7, 2010
IEEE Draft Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the...

January 1, 2009
Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...

March 20, 2000
IEEE Standard for a Mixed-Signal Test Bus
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,...