IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1149.4-1999

IEEE Standard for a Mixed-Signal Test Bus

superseded - Superseded by 1149.4-2010
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 20 March 2000
Status: superseded
Page(s): 1 - 84
ICS Code (Printed circuits and boards): 31.180
ISBN (Electronic): 978-0-7381-1756-0
DOI: 10.1109/IEEESTD.2000.91314
Standard:

" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,... View More

Document History

March 18, 2011
IEEE Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
October 7, 2010
IEEE Draft Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the...
January 1, 2009
Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
1149.4-1999
March 20, 2000
IEEE Standard for a Mixed-Signal Test Bus
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,...
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