IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1149.4-1999
IEEE Standard for a Mixed-Signal Test Bus
superseded
-
Superseded by
1149.4-2010
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 20 March 2000 |
| Status: | superseded |
| Page(s): | 1 - 84 |
| ICS Code (Printed circuits and boards): | 31.180 |
| ISBN (Electronic): | 978-0-7381-1756-0 |
| DOI: | 10.1109/IEEESTD.2000.91314 |
Standard:
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,... View More
Document History
March 18, 2011
IEEE Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
October 7, 2010
IEEE Draft Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the...
January 1, 2009
Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
1149.4-1999
March 20, 2000
IEEE Standard for a Mixed-Signal Test Bus
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,...
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