IEC - International Electrotechnical Commission - IEC 60333:1983

Test procedures for semiconductor charged-particle detectors

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 1 January 1983
Status: revised
Page Count: 69
ICS Code (Radiation measurements): 17.240

Document History

July 14, 1993
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be...
IEC 60333:1983
January 1, 1983
Test procedures for semiconductor charged-particle detectors
A description is not available for this item.
July 28, 1970
Test procedures for semiconductor detectors for ionizing radiation
A description is not available for this item.
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