IEC - International Electrotechnical Commission - IEC 60333:1970
Test procedures for semiconductor detectors for ionizing radiation
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 1 January 1970 |
| Status: | revised |
| Page Count: | 31 |
| ICS Code (Radiation measurements): | 17.240 |
Document History
July 14, 1993
Nuclear instrumentation - Semiconductor charged-particle detectors - Test procedures
Applies to semiconductor radiation detectors which are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described have been selected to be...
January 1, 1983
Test procedures for semiconductor charged-particle detectors
A description is not available for this item.
IEC 60333:1970
July 28, 1970
Test procedures for semiconductor detectors for ionizing radiation
A description is not available for this item.