IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1450.6/D1.6, Jun 2005
Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Replaced by Approved IEEE Draft)
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 January 2005 |
| Status: | inactive |
| ICS Code (Languages used in information technology): | 35.060 |
Document History
September 10, 2013
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...
January 1, 2006
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...
P1450.6/D1.6, Jun 2005
January 1, 2005
Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Replaced by Approved IEEE Draft)
A description is not available for this item.
January 1, 2005
IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
A description is not available for this item.
January 1, 2004
Upproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Superseded by P1450.6/D1.6)
A description is not available for this item.