IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1450.6/D1.5
Upproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Superseded by P1450.6/D1.6)
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2004 |
Status: | inactive |
ICS Code (Languages used in information technology): | 35.060 |
ISBN (Electronic): | 978-1-5044-4015-8 |
Document History

September 10, 2013
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...

January 1, 2006
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...

January 1, 2005
Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Replaced by Approved IEEE Draft)
A description is not available for this item.

January 1, 2005
IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
A description is not available for this item.

P1450.6/D1.5
January 1, 2004
Upproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Superseded by P1450.6/D1.6)
A description is not available for this item.