IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1450.6-2006

IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 10 September 2013
Status: active
Page(s): 1 - 120
ICS Code (Languages used in information technology): 35.060
ISBN (Electronic): 978-0-7381-4805-2
DOI: 10.1109/IEEESTD.2013.6573314
Standard:

The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In... View More

Document History

1450.6-2006
September 10, 2013
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...
1450.6-2005
January 1, 2006
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...
P1450.6/D1.6, Jun 2005
January 1, 2005
Unapproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Replaced by Approved IEEE Draft)
A description is not available for this item.
P1450.6/D1.6, Jun 2005
January 1, 2005
IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL)
A description is not available for this item.
P1450.6/D1.5
January 1, 2004
Upproved IEEE Draft Standard for Standard Test Interface Language (STIL) for Digital Test Vector Data - Core Test Language (CTL) (Superseded by P1450.6/D1.6)
A description is not available for this item.

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