IEEE - Institute of Electrical and Electronics Engineers, Inc. - C62.59-2019
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 31 October 2019 |
| Status: | active |
| Page(s): | 1 - 41 |
| ISBN (Electronic): | 978-1-5044-6119-1 |
| DOI: | 10.1109/IEEESTD.2019.8886679 |
Standard:
Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-201
Document History
C62.59-2019
October 31, 2019
IEEE Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
Supersedes IEEE C62.35-2010 and IEEE C62.35-2010/Cor1-2018. The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications...
September 3, 2019
IEEE Approved Draft Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard....
April 27, 2019
IEEE Draft Standard for Test Methods and Preferred Values for Silicon PN-Junction Clamping Diodes
The basic electrical parameters to be met by silicon PN junction voltage clamping components used for the protection of telecommunications equipment or lines from surges are defined in this standard....
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