IEEE - Institute of Electrical and Electronics Engineers, Inc. - 300-1982

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

superseded
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 10 November 1992
Status: superseded
Page(s): 1 - 30
ISBN (Electronic): 978-1-5044-0276-7
DOI: 10.1109/IEEESTD.1992.7405228
Standard:

The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution... View More

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300-1982
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IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution...
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IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
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