IEEE - Institute of Electrical and Electronics Engineers, Inc. - 300-1969

USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)

superseded
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 11 February 1969
Status: superseded
Page(s): 1 - 14
ISBN (Electronic): 978-1-5044-0275-0
DOI: 10.1109/IEEESTD.1969.7405207
Regular:

Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been... View More

Standard:

Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been... View More

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300-1969
February 11, 1969
USA Standard and IEEE Test Procedure for Semiconductor Radiation Detectors (For Ionizing Radiation)
Semiconductor radiation detectors have come into widespread use in recent years for detection and high-resolution spectroscopy of ionizing radiation. Both silicon and germanium detectors have been...
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