IEEE - Institute of Electrical and Electronics Engineers, Inc. - 300-1988

IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors

inactive - Reaffirmed , Revision of
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 29 December 1988
Status: inactive
Page(s): 1 - 125
ICS Code (Radiation measurements): 17.240
ISBN (Electronic): 978-0-7381-0674-8
DOI: 10.1109/IEEESTD.1988.122658
Standard:

This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected... View More

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IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
The object of this standard is to establish standard test procedures for semiconductor charged-particle detectors. These detectors are in wide-spread use for the detection and high resolution...
300-1988
December 29, 1988
IEEE Standard Test Procedures for Semiconductor Charged-Particle Detectors
This standard applies to semiconductor radiation detectors that are used for the detection and high-resolution spectroscopy of charged particles. The measurement techniques described were selected to...
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