IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1149.4/D14, Apr 2009
Standard for a Mixed-Signal Test Bus
inactive
Buy Now
| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 January 2009 |
| Status: | inactive |
| ICS Code (Printed circuits and boards): | 31.180 |
| ISBN (Electronic): | 978-1-5044-2888-0 |
Standard:
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together... View More
Document History
March 18, 2011
IEEE Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
October 7, 2010
IEEE Draft Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together with the...
P1149.4/D14, Apr 2009
January 1, 2009
Standard for a Mixed-Signal Test Bus
The testability structure for digital circuits described in IEEE Std 1149.1-2001 has been extended to provide similar facilities for mixed-signal circuits. The architecture is described, together...
March 20, 2000
IEEE Standard for a Mixed-Signal Test Bus
" The testability structure for digital circuits described in IEEE Std 1149.1-1990 has beenextended to provide similar facilities for mixed-signal circuits. The architecture is described,...
Related Products
Searching for related products...
Related Suppliers
Searching for related suppliers...