IEC - International Electrotechnical Commission - IEC 61967-4:2002/AMD1:2006

Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 ω/150 ω direct coupling method

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 9 February 2006
Status: published
Page Count: 13
ICS Code (Integrated circuits. Microelectronics): 31.200

Document History

Corrigendum 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 Ω/150 Ω direct coupling method
A description is not available for this item.
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
Specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 ω resistive probe and RF voltage...
IEC 61967-4:2002/AMD1:2006
February 9, 2006
Amendment 1 - Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions - 1 Ω/150 Ω direct coupling method
A description is not available for this item.
April 30, 2002
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz - Part 4: Measurement of conducted emissions, 1 ohm/150 ohm direct coupling method
Specifies a method to measure the conducted electromagnetic emission of integrated circuits by direct RF current measurement with a 1 ohm resistive probe and RF voltage measurement using a 150 ohm...
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