IEC - International Electrotechnical Commission - IEC 61649:2008
Weibull analysis
published
Buy Now
Organization: | IEC - International Electrotechnical Commission |
Publication Date: | 13 August 2008 |
Status: | published |
Page Count: | 138 |
ICS Code (Quality in general): | 03.120.01 |
ICS Code (Application of statistical methods): | 03.120.30 |
abstract:
IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is... View More
Document History

IEC 61649:2008
August 13, 2008
Weibull analysis
IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is...

May 16, 1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence...