IEC - International Electrotechnical Commission - IEC 61649:2008

Weibull analysis

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 13 August 2008
Status: published
Page Count: 138
ICS Code (Quality in general): 03.120.01
ICS Code (Application of statistical methods): 03.120.30
abstract:

IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is... View More

Document History

IEC 61649:2008
August 13, 2008
Weibull analysis
IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is...
May 16, 1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence...
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