IEC - International Electrotechnical Commission - IEC 61649:1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 16 May 1997 |
| Status: | revised |
| Page Count: | 31 |
| ICS Code (Quality in general): | 03.120.01 |
| ICS Code (Application of statistical methods): | 03.120.30 |
abstract:
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence... View More
Document History
August 13, 2008
Weibull analysis
IEC 61649:2008 provides methods for analysing data from a Weibull distribution using continuous parameters such as time to failure, cycles to failure, mechanical stress, etc. This standard is...
IEC 61649:1997
May 16, 1997
Goodness-of-fit tests, confidence intervals and lower confidence limits for Weibull distributed data
Provides numerical methods to complement graphical techniques in performing a goodness-of-fit test for Weibull distributed times to failure and gives an approximate procedure to obtain confidence...