IEC - International Electrotechnical Commission - IEC 60749:1984

Semiconductor devices - Mechanical and climatic test methods.

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 30 December 1984
Status: revised
Page Count: 59
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.

Establishes uniform preferred test methods with... View More

Document History

Semiconductor devices - Mechanical and climatic test methods
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values...
October 17, 2001
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods
A description is not available for this item.
July 31, 2000
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods
A description is not available for this item.
October 28, 1996
Semiconductor devices - Mechanical and climatic test methods
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values...
September 21, 1993
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
A description is not available for this item.
December 20, 1991
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.
A description is not available for this item.
IEC 60749:1984
December 30, 1984
Semiconductor devices - Mechanical and climatic test methods.
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values...
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