IEC - International Electrotechnical Commission - IEC 60749:1996
Semiconductor devices - Mechanical and climatic test methods
replaced
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 28 October 1996 |
| Status: | replaced |
| Page Count: | 95 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made.
Establishes uniform preferred test methods with... View More
Document History
April 10, 2002
Semiconductor devices - Mechanical and climatic test methods
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values...
October 17, 2001
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods
A description is not available for this item.
July 31, 2000
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods
A description is not available for this item.
IEC 60749:1996
October 28, 1996
Semiconductor devices - Mechanical and climatic test methods
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values...
September 21, 1993
Amendment 2 - Semiconductor devices - Mechanical and climatic test methods.
A description is not available for this item.
December 20, 1991
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods.
A description is not available for this item.
December 30, 1984
Semiconductor devices - Mechanical and climatic test methods.
Lists test methods applicable to semiconductor devices (discrete devices and integrated circuits) from which a selection may be made. Establishes uniform preferred test methods with preferred values...