IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1445/D12, Sept 2016

IEEE Approved Draft Standard for Digital Test Interchange Format (DTIF)

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2016
Status: inactive
Page(s): 1 - 69
ICS Code (Software): 35.080
ISBN (Electronic): 978-1-5044-2401-1
Standard:

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for... View More

Document History

January 27, 2017
IEEE Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
January 1, 2016
IEEE Draft Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
P1445/D12, Sept 2016
January 1, 2016
IEEE Approved Draft Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
March 10, 1999
IEEE Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
January 1, 1998
IEEE Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
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