IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1445-1998

IEEE Standard for Digital Test Interchange Format (DTIF)

superseded - Reaffirmed , Superseded by
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 10 March 1999
Status: superseded
Page(s): 1 - 108
ICS Code (Software): 35.080
ISBN (Electronic): 978-0-7381-1554-2
DOI: 10.1109/IEEESTD.1999.7862114
Standard:

The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for... View More

Document History

January 27, 2017
IEEE Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
January 1, 2016
IEEE Draft Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
January 1, 2016
IEEE Approved Draft Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
1445-1998
March 10, 1999
IEEE Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
January 1, 1998
IEEE Standard for Digital Test Interchange Format (DTIF)
The information content and the data formats for the interchange of digital test program data between digital automated test program generators (DATPGs) and automatic test equipment (ATE) for...
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