IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1658/D8.8, Jun 2011

IEEE Draft Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 28 July 2011
Status: inactive
Page(s): 1 - 127
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Online): 978-0-7381-6770-1
DOI: 10.1109/IEEESTD.2011.5967871
Standard:

This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test Digital to Analog Converters (DACs). It is restricted to monolithic,... View More

Document History

February 10, 2012
IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and...
P1658/D8.8, Jun 2011
July 28, 2011
IEEE Draft Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test Digital to Analog Converters (DACs). It is restricted to monolithic,...
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