IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1658-2011

IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 10 February 2012
Status: active
Page(s): 1 - 126
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Online): 978-0-7381-7147-0
DOI: 10.1109/IEEESTD.2012.6152113
Regular:

Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and... View More

Standard:

Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and... View More

Document History

1658-2011
February 10, 2012
IEEE Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
Terminology and test methods to clearly document prevalent world-wide terms used to describe and test digital-to-analog converters (DACs) are provided. It is restricted to monolithic, hybrid, and...
P1658/D8.8, Jun 2011
July 28, 2011
IEEE Draft Standard for Terminology and Test Methods of Digital-to-Analog Converter Devices
This standard defines terminology and test methods to clearly document prevalent world-wide terms used to describe and test Digital to Analog Converters (DACs). It is restricted to monolithic,...

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