IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1581/D1.37, Jan 2011

IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 21 February 2011
Status: inactive
Page(s): 1 - 63
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Online): 978-0-7381-6501-1
DOI: 10.1109/IEEESTD.2011.5719638
Standard:

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing... View More

Document History

June 20, 2011
IEEE Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing...
P1581/D1.37, Jan 2011
February 21, 2011
IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing...
October 8, 2010
IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing...
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