IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1581-2011

IEEE Standard for Static Component Interconnection Test Protocol and Architecture

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 20 June 2011
Status: active
Page(s): 1 - 61
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Online): 978-0-7381-6613-1
DOI: 10.1109/IEEESTD.2011.5930310
Regular:

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing... View More

Standard:

IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing... View More

Document History

1581-2011
June 20, 2011
IEEE Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory integrated circuits (ICs) where additional pins for testing are not available and implementing...
P1581/D1.37, Jan 2011
February 21, 2011
IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing...
P1581
October 8, 2010
IEEE Draft Standard for Static Component Interconnection Test Protocol and Architecture
IEEE Std 1581 defines a low-cost method for testing the interconnection of discrete, complex memory Integrated Circuits (ICs) where additional pins for testing are not available and implementing...

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