IEEE - Institute of Electrical and Electronics Engineers, Inc. - P62.32_D12, Nov 2009
IEEE Draft Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2009 |
Status: | inactive |
ICS Code (Substations. Surge arresters): | 29.240.10 |
ISBN (Electronic): | 978-1-5044-2502-5 |
Standard:
This standard applies to the avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc. The avalanche breakdown diode surge... View More
Document History

P62.32_D12, Nov 2009
January 1, 2009
IEEE Draft Standard Test Methods for Avalanche Junction Semiconductor Surge-Protective Device Components
This standard applies to the avalanche breakdown diodes used for surge protection on systems with voltages equal to or less than 1000 V rms or 1200 V dc. The avalanche breakdown diode surge...