IEEE - Institute of Electrical and Electronics Engineers, Inc. - P1450.3/D14

Unapproved IEEE Draft for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for DC Level Specification

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2006
Status: inactive
ICS Code (Languages used in information technology): 35.060
ISBN (Electronic): 978-1-5044-2947-4
Standard:

Define structures in STIL for the specification of resource mapping of ATE hardware architectures. An example of resource mapping is the assignment of tester resources to waveform characters that... View More

Document History

September 7, 2007
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
The STIL environment supports transferring tester-independent test programs to a specific automated testing equipment (ATE) system. Although native STIL data are tester independent, the actual...
January 1, 2006
Unapproved IEEE Draft for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for DC Level Specification
Define structures in STIL for the specification of resource mapping of ATE hardware architectures. An example of resource mapping is the assignment of tester resources to waveform characters that are...
P1450.3/D14
January 1, 2006
Unapproved IEEE Draft for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for DC Level Specification
Define structures in STIL for the specification of resource mapping of ATE hardware architectures. An example of resource mapping is the assignment of tester resources to waveform characters that are...
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