IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1450.3-2007
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
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Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 7 September 2007 |
Status: | inactive |
Page(s): | 1 - 84 |
ICS Code (Languages used in information technology): | 35.060 |
ISBN (Electronic): | 978-0-7381-5518-0 |
DOI: | 10.1109/IEEESTD.2007.4301375 |
Regular:
The STIL environment supports transferring tester-independent test programs to a specific automated testing equipment (ATE) system. Although native STIL data are tester independent, the actual... View More
Standard:
The STIL environment supports transferring tester-independent test programs to a specific ATE system. Although native STIL data are tester independent, the actual process of mapping the test... View More
Document History

1450.3-2007
September 7, 2007
IEEE Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for Tester Target Specification
The STIL environment supports transferring tester-independent test programs to a specific automated testing equipment (ATE) system. Although native STIL data are tester independent, the actual...

January 1, 2006
Unapproved IEEE Draft for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for DC Level Specification
Define structures in STIL for the specification of resource mapping of ATE hardware architectures. An example of resource mapping is the assignment of tester resources to waveform characters that are...

January 1, 2006
Unapproved IEEE Draft for Extensions to Standard Test Interface Language (STIL) (IEEE Std. 1450-1999) for DC Level Specification
Define structures in STIL for the specification of resource mapping of ATE hardware architectures. An example of resource mapping is the assignment of tester resources to waveform characters that are...