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IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1149.1-2013

IEEE Standard for Test Access Port and Boundary-Scan Architecture

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 13 May 2013
Status: active
Page(s): 1 - 444
ICS Code (Printed circuits and boards): 31.180
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Online): 978-0-7381-8263-6
DOI: 10.1109/IEEESTD.2013.6515989
Regular:

Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The... View More

Standard:

Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The... View More

Document History

IEEE Approved Draft Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
1149.1-2013
May 13, 2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
May 13, 2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture - Redline
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
December 5, 2012
IEEE Draft Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
October 24, 2012
IEEE Draft Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards is defined. The circuitry includes a standard interface...
July 23, 2001
IEEE Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface...
March 1, 1995
IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)
Superseded by 1149.1-2001 A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language...
May 21, 1990
IEEE Standard Test Access Port and Boundary-Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface...
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