IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1149.1b-1994
IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)
superseded
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Amendment to
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 March 1995 |
| Status: | superseded |
| Page(s): | 1 - 80 |
| ICS Code (Printed circuits and boards): | 31.180 |
| ICS Code (Interface and interconnection equipment): | 35.200 |
| ISBN (Electronic): | 978-0-7381-0960-2 |
| DOI: | 10.1109/IEEESTD.1995.122623 |
Standard:
Superseded by 1149.1-2001 A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language... View More
Document History
May 13, 2013
IEEE Approved Draft Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
May 13, 2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
May 13, 2013
IEEE Standard for Test Access Port and Boundary-Scan Architecture - Redline
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
December 5, 2012
IEEE Draft Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards and the test of internal circuits is defined. The circuitry...
October 24, 2012
IEEE Draft Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance and support of assembled printed circuit boards is defined. The circuitry includes a standard interface...
July 23, 2001
IEEE Standard Test Access Port and Boundary Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface...
1149.1b-1994
March 1, 1995
IEEE Supplement to Standard Test Access Port and Boundary-Scan Architecture (1149.1)
Superseded by 1149.1-2001 A language to describe components that conform to IEEE Std 1149.1-1990 is described in this supplement. The language is based on the VHSIC Hardware Description Language...
May 21, 1990
IEEE Standard Test Access Port and Boundary-Scan Architecture
Circuitry that may be built into an integrated circuit to assist in the test, maintenance, and support of assembled printed circuit boards is defined. The circuitry includes a standard interface...
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