IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1450.6-2005
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
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| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 24 February 2012 |
| Status: | active |
| Page(s): | 1 - 120 |
| ISBN (Online): | 978-0-7381-4805-2 |
| DOI: | 10.1109/IEEESTD.2012.6157581 |
Standard:
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In... View More
Document History
1450.6-2005
February 24, 2012
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...
July 13, 2009
IEEE Standard for Describing On-Chip Scan Compression
This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for...
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