IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1450.6.1-2009

IEEE Standard for Describing On-Chip Scan Compression

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 13 July 2009
Status: inactive
Page(s): 1 - 56
ICS Code (Languages used in information technology): 35.060
ISBN (Electronic): 978-0-7381-5962-1
DOI: 10.1109/IEEESTD.2009.5165453
Standard:

This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for... View More

Document History

1450.6-2005
February 24, 2012
IEEE Standard Test Interface Language (STIL) for Digital Test Vector Data-Core Test Language (CTL)
The Core Test Language (CTL) is a language created for a System-on-Chip flow (or SoC flow), where a design created by one group is reused as a sub-design of a design created by another group. In an...
1450.6.1-2009
July 13, 2009
IEEE Standard for Describing On-Chip Scan Compression
This standard defines how the necessary information is passed from scan insertion to pattern generation and from pattern generation to diagnosis such that different tool vendors could be used for...

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