IEEE - Institute of Electrical and Electronics Engineers, Inc. - 62525-2007

(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data

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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 9 December 2007
Status: active
Page(s): 1 - 143
ICS Code (Integrated circuits. Microelectronics): 31.200
ISBN (Electronic): 2-8318-9337-2
DOI: 10.1109/IEEESTD.2007.4432411
Regular:

Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of... View More

Standard:

Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of... View More

Document History

December 9, 2007
(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data
Standard Test Interface Language (STIL) provides an interface between digital test generationtools and test equipment. A test description language is defined that: (a) facilitates the transferof...
62525-2007
December 9, 2007
(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data
Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of...
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