IEEE - Institute of Electrical and Electronics Engineers, Inc. - 62525-2007
(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data
active
Buy Now
| Organization: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 9 December 2007 |
| Status: | active |
| Page(s): | 1 - 143 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
| ISBN (Electronic): | 2-8318-9337-2 |
| DOI: | 10.1109/IEEESTD.2007.4410455 |
Standard:
Standard Test Interface Language (STIL) provides an interface between digital test generationtools and test equipment. A test description language is defined that: (a) facilitates the transferof... View More
Document History
62525-2007
December 9, 2007
(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data
Standard Test Interface Language (STIL) provides an interface between digital test generationtools and test equipment. A test description language is defined that: (a) facilitates the transferof...
December 9, 2007
(IEEE Std 1450-1999) International Standard Test Interface Language (STIL) for Digital Test Vector Data
Standard test interface language (STIL) provides an interface between digital test generation tools and test equipment. A test description language is defined that: (a) facilitates the transfer of...
Related Products
Searching for related products...
Related Suppliers
Searching for related suppliers...