IEEE - Institute of Electrical and Electronics Engineers, Inc. - 1005-1991

IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays

superseded - Superseded by 1005-1998
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Organization: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 17 October 1991
Status: superseded
Page(s): 1 - 41
ICS Code (Transistors): 31.080.30
ISBN (Electronic): 978-1-5593-7136-0
DOI: 10.1109/IEEESTD.1991.101070
Standard:

An introduction to the physics unique to this type of memory and an overview of typical array architectures are presented. The variations on the basic floating gate nonvolatile cell structure that... View More

Document History

January 1, 1998
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
Summary form only given. This standard describes the underlying physics and the operation of floating gate memory arrays, specifically, UV erasable EPROM, byte rewritable E/sup 2/PROMs, and block...
1005-1991
October 17, 1991
IEEE Standard Definitions and Characterization of Floating Gate Semiconductor Arrays
An introduction to the physics unique to this type of memory and an overview of typical array architectures are presented. The variations on the basic floating gate nonvolatile cell structure that...
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