EMC filters in high voltage traction drive systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Weber
Year: 2008
Numerical analysis of electromagnetic field distributions in a typical aircraft
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Hikage; T. Nojima; M. Omiya; K. Yamamoto
Year: 2008
Experiments for educating electromagnetic effects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Leferink; I. Knijff; A. Roc'h
Year: 2008
Evaluation of the disturbing potential of IEMI using mathematical norms and analytical calculations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Korte; H. Garbe
Year: 2008
TEM horn antenna for detection of impulsive noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qingshan Shan; I.A. Glover; P.J. Moore; I.E. Portugues; M. Judd; R. Rutherford; R.J. Watson
Year: 2008
RFID transponders' RF emissions in aircraft communication and navigation radio bands
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.X. Nguyen; J.J. Ely; S.V. Koppen; M.S. Fersch
Year: 2008
Source identification and correlation between near field-far field tolerances when applying a genetic algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hongmei Fan; F. Schlagenhaufer
Year: 2008
New Common Mode EMI filter for motor drive using a fourth leg in the inverter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dongsheng Zhao; B. Ferreira; A. Roch; F. Leferink
Year: 2008
Measurement of the local distribution of the electric field coupled into shielding enclosures via apertures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Dyballa; K. Haake; R. Kebel; T. Stadtler; J.L. ter Haseborg
Year: 2008
Signal processing for generation of complex multiport transfer functions from medium quality time-domain measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Stadtler; J.L. ter Haseborg
Year: 2008
City planning and development using geographic information systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Kamal
Year: 2008
An improved keyword extraction method using graph based random walk model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Islam; M.R. Islam
Year: 2008
Action recognition with various speeds and timed-DMHI feature vectors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ahad; J.K. Tan; H.S. Kim; S. Ishikawa
Year: 2008
Regression diagnostics in large and high dimensional data
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A.M. Nurunnabi; M. Nasser
Year: 2008
Implementation of e-governance: Only way to build a corruption-free Bangladesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A.A. Rajon; S.A. Zaman
Year: 2008
A system for locating users of WLAN using dynamic mapping in indoor and outdoor environment-LOIDS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.K. Naik; M.N.G. Prasad
Year: 2008
Notice of Violation of IEEE Publication Principles
Active noise control for industrial applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.F. Islam; A.H.M.S. Islam; M.M.R. Billah
Year: 2008
Side channel attack prevention for AES smart card
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.Z. Rahaman; M.A. Hossain
Year: 2008
Performance evaluation of dode of a voice/data integrated wireless mobile network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.M. Rahat; R. Laila; S.R. Juthy; M.I. Islam; M.R. Amin
Year: 2008
Evaluation of traffic parameters of multidimensional traffic of a combined link using a tabular method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Islam; S. Karim; J.K. Das; M.R. Amin
Year: 2008
A new weighted centroid localization algorithm in wireless sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Forghani
Year: 2008
A lossless image compression technique using generic peano pattern mask tree
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.K. Hossain; S.M. Imam; K.S. Hasan; W. Perrizo
Year: 2008
A concurrent approach to clustering algorithm with applications to VLSI domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M.A. Iqbal; M.I. Monir; T. Sayeed; A.H.M. Misbah-Uddin
Year: 2008
An energy-efficient data security system for wireless sensor network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Rahman; M.K. Debnath
Year: 2008
An efficient implementation scheme for multidimensional online analytical processing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Easmin; K. Hasan; N. Parvin
Year: 2008
Short messaging service (SMS) based m-banking system in context of Bangladesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Jamil; F.A. Mousumi
Year: 2008
An application program interface for vBulletin
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Sami; T. Rahman; K.S. Hasan; J. Siddique
Year: 2008
Cutting a cornered convex polygon out of a circle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.I. Ahmed; M.A. Islam; M. Hasan
Year: 2008
A new distributed evolutionary computation technique for solving large number of equations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Jahan; M. Hashem; G.A. Shahriar
Year: 2008
MIMOME channel secrecy capacity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Islam; Jinsang Kim; M.S. Arefin
Year: 2008
On the design of an effective corpus for evaluation of Bengali Text Compression Schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Islam; S.A.A. Rajon
Year: 2008
A study of major Mobile payment systems' functionality in Europe
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mohammadi; H. Jahanshahi
Year: 2008
Achieving guaranteed performance on computational Grid
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. De Sarkar; D. Ghosh; R. Mukhopadhyay; N. Mukherjee
Year: 2008
A cost effective multi-granular location information strategy for MANET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Majumder; S.R. Biradar; S.K. Sarkar
Year: 2008
On hot-spot traffic pattern of TESH network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M.H. Rahman; Y. Inoguchi; Y. Sato; Y. Miura; S. Horiguchi
Year: 2008
An effective term weighting method using random walk model for text classification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Islam; M.R. Islam
Year: 2008
QoS based Fair Load-Balancing: Paradigm to IANRA Routing Algorithm for Wireless Networks (WNs)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.A. Moghanjoughi; S. Khatun; B.M. Ali; R.S.A.R. Abdullah
Year: 2008
Codebook design method for speaker identification based on Genetic Algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Islam; M.F. Rahman; M.R. Amin; M.S.U. Zaman
Year: 2008
Analysis of broadband slotted microstrip patch antenna
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.T. Islam; M.N. Shakib; N. Misran; B. Yatim
Year: 2008
A Corpus-based evaluation of lexical components of a domain-specific text to Knowledge Mapping prototype
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Shams; A. Elsayed
Year: 2008
Comparisons of maximum system lifetime in diverse scenarios for body sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.I. Mondal; S.U. Zaman; A. Al Masud; J. Alam
Year: 2008
Layer-2 protocol adaptation method to improve fast handoff for mobile IPv6 vertical handoffs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Solouk; B.M. Ali; S. Khatun; D. Wong; M.A. Mahdi
Year: 2008
Decision Tree based Routine Generation (DRG) algorithm: A data mining advancement to generate academic routine for open credit system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Rahman; S.S. Giasuddin; R. Rahman
Year: 2008
Extended algorithm for spatial characterization and discrimination rules
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Hasan; Z. Hossain; F.M. Chowdhury; M.K. Hasan
Year: 2008
Amplitude banded technique and parallel structure for Godard and Sato algorithms of blind channel equalization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.L.R. Khan; M.H. Wondimagegnehu; T. Shimamura
Year: 2008
Routing algorithm for vertically stacked optical banyan networks with the time complexity O(N) using pipelined processors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.-u.-R. Khandker
Year: 2008
Simulation and bit error rate performance analysis of 4G OFDM systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Ali; M. Rahman; D. Hossain; S. Islam; M. Islam
Year: 2008
Isolating significant phrases in common natural language queries to databases
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Hoque; M.S. Mahbub; S.M.A. Al-Mamun
Year: 2008
Emotion-driven learning agent for setting rich presence in mobile telephony
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Saha; R. Quazi
Year: 2008
Low-cost realization of toffoli gate for the low-cost synthesis of quantum ternary logic functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Hasan
Year: 2008
Structural operational semantics of packages in Java
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Al Farook; M.S. Arefin; M.M. Hoque
Year: 2008
Two-Level Dictionary-Based Text Compression Scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z.K. Zia; D.F. Rahman; C.M. Rahman
Year: 2008
Design and implementation of microprocessor based electronic voting system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Alam; M. Masum; M. Rahman; A. Rahman
Year: 2008
Automated digital archive for land registration and records
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Toaha; S. Khan
Year: 2008
Face recognition using Gabor Filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.T. Rahman; M.A. Bhuiyan
Year: 2008
Meliorated approach for extracting bilingual terminology from Wikipedia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anand Gupta; A. Goyal; A. Bindal; Ankuj Gupta
Year: 2008
Generation of random channel specifications for channel routing problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pal; T.N. Mandal; A.K. Datta; D. Kundu; R.K. Pal
Year: 2008
Vision system for human-robot interface
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.E. Islam; N. Begum; M.A.-A. Bhuiyan
Year: 2008
A crosstalk free routing algorithm of Generalized Recursive Non-blocking Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sultana; G. Chowdhury; M. Rahman
Year: 2008
Learning intrusion detection based on adaptive bayesian algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.M. Farid; M.Z. Rahman
Year: 2008
Comparing FLV and MPEG4 (H.264/AVC) multimedia file format with wireless network parameters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Mahmud; S. Monir; T. Khan; M.A.R. Mustafa; H. Sarwar
Year: 2008
Lower bound on blocking probability for vertically stacked optical banyan networks with given crosstalk constraint
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Sultana; M.R. Khandker
Year: 2008
Performance of fast routing algorithm for Vertically Stacked Optical Banyan networks with link failures and given crosstalk constraint
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Sultana; M.R. Khandker
Year: 2008
The channel capacity of a GSM frequency hopping network with intelligent underlay-overlay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M.I. Rajib; W. Nasrin
Year: 2008
Genetic Algorithm based synthesis of ternary Reversible/Quantum circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Khanoma; T. Kamalb; M. Khana
Year: 2008
Analytical performance evaluation of space time coded MIMO OFDM systems impaired by timing jitter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R.H. Mondal; S.P. Majumder
Year: 2008
Cell database based time specific resource Reservation scheme
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M. Didar-Al-Alam; M.N. Hasan; M.M. Islam; A. Azim
Year: 2008
New methodologies for high level modeling and synthesis of low density parity check decoders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.M. Aziz; S. Sharma
Year: 2008
Efficient Generation of Combinatorial Families
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.I. Bhuyan; S. Rahman
Year: 2008
An Algorithm for Segmenting Modifiers from Bangla Text
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Akter; S. Hossain; M.T. Islam; H. Sarwar
Year: 2008
Density based clustering technique for efficient data mining
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Rahman; A.K.M.R. Chowdhury; D.M.J. Rahman; A.R.M. Kamal
Year: 2008
Performance comparison of IPv4 and IPv6 on various windows operating systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Narayan; S.S. Kolahi; Y. Sunarto; D. Nguyen; P. Mani
Year: 2008
An empirical framework for translating of Phrasal verbs of English sentence into Bangla
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M. Hoque; M.M. Ahamad; M.S. Arefin; M. Monjur-Ul-Hasan; M.G. Hossain
Year: 2008
Generation of mountain ranges by modifying a controlled terrain generation approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.R. Kamal; M. Kaykobad
Year: 2008
File sharing in advanced collaborating environment: Node registration & cache optimization techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Rahman; M.A.A. Khan; T.K. Avi; M.R. Huq
Year: 2008
A machine vision based automatic system for real time recognition and sorting of Bangladeshi bank notes.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.F. Sajal; M. Kamruzzaman; F.A. Jewel
Year: 2008
An HPSG analysis of Arabic passive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.S.I. Bhuyan; R. Ahmed
Year: 2008
Cluster analysis of microarray data of Shewanella oneidensis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Nilufar; M. Ara
Year: 2008
Smallest and some new equiprojective polyhedra
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hasan; M.M. Hossain; S. Nusrat; A. Lopez-Ortiz
Year: 2008
A new approach to wrap legacy programs into web services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Parsa; L. Ghods
Year: 2008
A New Proposal for Choosing a Deflection Link in a Deflection Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Rahman; M.T. Hossain; S. Anwar
Year: 2008
A comprehensive analysis of degree based condition for hamiltonian cycles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.K. Hasan; M. Kaykobad; Young-Koo Lee; Sungyoung Lee
Year: 2008
End-to-end mobility management solutions for TCP: An analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.A. Shah; M. Yousaf
Year: 2008
Dynamic communication performance of a TESH network under the nonuniform traffic patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.M.H. Rahman; Y. Inoguchi; Y. Sato; Y. Miura; S. Horiguchi
Year: 2008
WalkSAT approach in solving the staff transfer problem
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Acharyya
Year: 2008
A novel fuzzy method to traffic light control based on unidirectional selective cellular automata for urban traffic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Shakeri; H. Deldari; A. Rezvanian; H. Foroughi
Year: 2008
A least square approach for TDOA/AOA wireless location in WCDMA system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Nur-A-Alam; M.M. Haque
Year: 2008
Distortion measurement using arc-length-parameterisation within a vertex-based shape coding framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F.A. Sohel; M. Bennamoun
Year: 2008
Bangla vowel sign recognition by extracting the fuzzy features
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.S. Kamal; M.M. Hoque; M. Ul Hasan; M.S. Arefin
Year: 2008
Speech enabled operating system control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Kader; B. Singha; M.N. Islam
Year: 2008
Time-frequency representation of audio signals using Hilbert spectrum with effective frequency scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.I. Molla; M. Shaikh; K. Hirose
Year: 2008
Design of an interactive bangla mobile keypad based on ergonomics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Alam; M. Masum; S.H. Tareq; M.W. Numan
Year: 2008
Prediction of the density of active wireless device using markov model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Gani; I.J. Mehedi; M. Seraj; H. Sarwar; C.M. Rahman
Year: 2008
Crosstalk and bit error rate performance of a proposed optical cross-connect topology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.P. Hossen; M.A. Siddique; M.R. Islam
Year: 2008
Performance investigation of earth-to-satellite microwave link due to rain fade in Bangladesh
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.R. Islam; M.A. Rahman; F. Anwar; M.M. Rashid
Year: 2008
Server consolidation using OpenVZ: Performance evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ahmed; S. Zahda; M. Abbas
Year: 2008
An artificial Ant based novel and efficient approach of regular geometric shape detection from digital image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Acharya; K. Chattopadhyay; D. Maiti; A. Konar
Year: 2008
Solutions to motion self-occlusion problem in human activity analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A.R. Ahad; J.K. Tan; H.S. Kim; S. Ishikawa
Year: 2008
An intelligent aviation obstruction warning light
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Hasan; B.C. Sarker
Year: 2008
Geospatial Web Services in environmental planning
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.U. Sikder
Year: 2008
Selecting signature optical emission spectroscopy variables using sparse principal component analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Ma; S. McLoone; J. Ringwood; N. Macgearailt
Year: 2008
Identifying Stock Similarity Based on Episode Distances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Dattasharma; P.K. Tripathi; S. Gangadharpalli
Year: 2008
Reversible Data Hiding using Increased Peak Histogram
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.C. Thanuja; R. Nagaraj; M. Uttara Kumari
Year: 2008
An efficient clustering based texture feature extraction for medical image
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.H. Mohamed; M.M. AbdelSamea
Year: 2008
A trust-based distributed data fault detection algorithm for wireless sensor networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Taghikhaki; M. Sharifi
Year: 2008
Disassembling SLAs for follow-up processes in an SOA system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Hao Hsu; Yun-Wei Liao; Chien-Pang Kuo
Year: 2008
Anycast routing in Delay Tolerant Networks using genetic algorithms for route decision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.R. da Silva; P.R. Guardieiro
Year: 2008
An optimized solution for mobile computing environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Punithavathi; K. Duraiswamy
Year: 2008
A set of classical factors for rule mining in pruning methods
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ravichandran; P. Sengottuvelan; A. Shanmugam
Year: 2008
Private and secure service discovery via progressive approach in pervasive computing environments
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Durga; S. Salaja
Year: 2008
A new robust distributed real time scheduling services for RT-CORBA applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.S. Karuppan; B.T. Mathew; K. Shanthakumari
Year: 2008
Investigations in single document summarization by extraction method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hariharan; R. Srinivasan
Year: 2008
Zernike based scene categorization using artificial neural networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Devendran; H. Thiagarajan; A. Wahi
Year: 2008
Data mining techniques for teaching result analysis using rough set theory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Ramasubramanian; K. Iyakutti; P. Thangavelu; G.J. Jeya; S.S. Begam
Year: 2008
Detection and defense against DDoS attack with IP spoofing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.B. Mopari; S.G. Pukale; M.L. Dhore
Year: 2008
Filtering spoofed traffic at source end for defending against DoS / DDoS attacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Malliga; A. Tamilarasi; M. Janani
Year: 2008
Real time cryptography with dual key encryption
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Lakshmi; T.N. Prabakar; E. Kirubakaran
Year: 2008
FSM based Manchester encoder for UHF RFID tag emulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Khan; M. Sharma; P.R. Brahmanandha
Year: 2008
Design and implementation of pipelined MB-OFDM UWB transmitter backend modules on FPGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Santhi; M.S. Kumar; G. Lakshminarayanan; T.N. Prabakar
Year: 2008
A modified radix-24 SDF pipelined OFDM module for FPGA based MB-OFDM UWB systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Santhi; S. Arun Kumar; G.S.P. Kalish; K. Murali; S. Siddharth; G. Lakshminarayanan
Year: 2008
Coupling optimization in holographic coupler - Large Area Dispersion Flattened Fiber system:
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.K. Tripathy; M. Hota; P. Nayak
Year: 2008
Design and analysis of fractal microstrip low pass filter with open circuited stubs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Kumar; C. Jagdeesh; R.N. Baral; P.K. Singhal
Year: 2008
An invariant approach to object classification using background removal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Nagarajan; P. Balasubramanie
Year: 2008
A novel algorithm for segmentation and classification of Malayalam characters through characterization using dominant singular values
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Philip; R.D. Sudhaker Samuel
Year: 2008
A hybrid transformation with a filter for advanced video coding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ezhilarasan; P. Thambidurai; G. Harish; M. Muthuraman; R. Arulsezhian; A. Arun; V.V. Anand; S.D. Kumar; P.N. Krishnan
Year: 2008
Texture categorization using statistical and spectral features
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Arivazhagan; S.S. Nidhyanandhan; R.N. Shebiah
Year: 2008
Quad-tree based impulse detection and rank-ordered regularization for the restoration of impulse corrupted digital images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Saudia; J. Varghese; K. Nallaperumal; S. Allwin; S. Annam; P. Kumar
Year: 2008
Anisotropic diffusion segmentation for the quantification of mitral regurgitation using proximal flow convergence method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Abdul Khayum; M.N. Giriprasad; P.V. Sridevi
Year: 2008
Use of perceptual features in iterative clustering based twins identification system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Revathi; Y. Venkataramani
Year: 2008
A hybrid feature extraction method-based object recognition by neural network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Wahi; F.M. Athiq; C. Palanisamy
Year: 2008
Depth computations using data in the form of intensity of pixels for enhanced computer vision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sandyarani; V. Vaithyanathan
Year: 2008
Nanocluster carbon thin film as a semiconducting layer and feasibility for device application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Gaurav; S. Bhatnagar; R. Raj; S. De; S. Niranjana; B.S. Satyanarayana
Year: 2008
Hexagonal Capacitance Micromachined Ultrasonic Transducer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kumar Tiwari; B.S. Satyanarayana; A. Gopalkrishna Pai; K.K. Trivedi; N.S. Rahul; P. Sahay
Year: 2008
Design and simulation of fuzzy controller for a grid connected stand alone PV system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Thiagarajan; T.S. Sivakumaran; P. Sanjeevikumar
Year: 2008
Investigation of the techniques deployed in spectrum slicing for microwave photonic filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Sukanesh; R.K. Jeyachitra; P. Gautham; A. Raja; S. Ajmera
Year: 2008
Collision avoidance scheme in energy constrained wireless sensor networks using MAC Protocol
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Rajsekar; M.K. Mathew; N. Dineshraj; S.R. Barath; M.N. Sudha; M.L. Valarmathi
Year: 2008
Comparitive study of turbo decoding techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Samayabalan; N. Prabhuraj; V. Tholkapiyan
Year: 2008
Influence of gate engineering on the analog and RF performance of DG MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Mohankumar; B. Syamal; C.K. Sarkar; S. Ravi
Year: 2008
Computer Aided Interactive Learning of Engineering Graphics - An E-Learning Module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.N. Raol; V. Vaithyanathan
Year: 2008
Forwarding loop avoidance using ordered forwarding information base updates in wired networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Jeba; A.G. Vani
Year: 2008
Order reduction by error minimization technique
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ramesh; A. Nirmalkumar; G. Gurusamy
Year: 2008
Achieving load balancing in heterogeneous peer-to-peer netjworks by allocating and reallocating process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Ibrahim; M.S. Thanabal
Year: 2008
An architectural enhancement to increase throughput of a hard disc drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Rajendran; K. Krishnakumar
Year: 2008
Security management in Kerberos V5 for GSM network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Jaiganesh; B. Ramdoss
Year: 2008
Zero Defects Quality and Reliability Challenges for Growing Markets
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Dakshinamoorthy
Year: 2008
The effect of recovery on NBTI characterization of thick non-nitrided oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Reisinger; R.P. Vollertsen; P.J. Wagner; T. Huttner; A. Martin; S. Aresu; W. Gustin; T. Grasser; C. Schlunder
Year: 2008
Total Recovery of Defects Generated by Negative Bias Temperature Instability (NBTI)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Benard; J.-L. Ogier; D. Goguenheim
Year: 2008
Advanced On-The-Fly Method with Correction of Initial Values to Characterize Negative Bias Temperature Instability Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Benard; J.-L. Ogier; D. Goguenheim
Year: 2008
Copper line topology impact on the reliability of low-k SIOCH for the 45nm technology node and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Vilmay; D. Roy; C. Monget; F. Volpi; J.-M. Chaix
Year: 2008
Impact of Oxygen Vacancies Profile and Fringe Effect on Leakage Current Instability of Tantalum Pentoxide Metal-Insulator-Metal (MIM) Capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Martinez; C. Besset; F. Monsieur; L. Montes; G. Ghibaudo
Year: 2008
The Influence Of Complex Geometries And Stress Non-Uniformity On Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Aal
Year: 2008
Stress Characterization for Stress-Induced Voiding in Cu/Low K Interconnects with Geometry and Upper Cap Layer Dependences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mingte Lin; J.W. Liang; K.C. Su
Year: 2008
Ageing under illumination of MOS transistors for active pixel sensors (APS) applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Lopez; F. Monsieur; S. Ricq; J.-M. Roux; F. Balestra
Year: 2008
Investigation of GIDL current Injection Disturb Mechanism in two-transistor-eNVM memory devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.R. Kim; K.J. Han; Junmin Lee; T. Zhou; K.S. Lee; P. Liu; P.Y. Lee; Huan-Chung Tseng; B. Cronquist
Year: 2008
Effect of substrate hot carrier stress on high-k gate stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hokyung Park; G. Bersuker; Chang Yong Kang; C. Young; Hsing-Huang Tseng; R. Jammy
Year: 2008
Temperature (5.6-300K) Dependence Comparison of Carrier Transport Mechanisms in HfO2/SiO2 and SiO2 MOS Gate Stacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.G. Southwick; J. Reed; C. Buu; H. Bui; R. Butler; G. Bersuker; W.B. Knowlton
Year: 2008
Positive Bias Temperature Instability Effects in advanced High-k / Metal Gate NMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.P. Ioannou; S. Mittl; G. LaRosa
Year: 2008
Breakdown mechanism for the thin EOT Dy2O3/HfO2 dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tackhwi Lee; Sung Il Park; J.C. Lee; S.K. Banerjee
Year: 2008
Geometry effects on the NBTI degradation of PMOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Math; C. Benard; J.-L. Ogier; D. Goguenheim
Year: 2008
Study of Transistor and Product NBTI Lifetime Distributions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Qin; Baoguang Yan; Y. Shoshany; D. Roy; H. Rahamim; H. Marom; J.B. Bernstein
Year: 2008
Interface Traps in Silicon Carbide MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.J. Cochrane; P.M. Lenahan; A.J. Lelis
Year: 2008
Effect of Threshold-Voltage Instability on SiC DMOSFET Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.J. Lelis; R. Green; D. Habersat; N. Goldsman
Year: 2008
Coupled Approach for Reliability Study of Fully Self Aligned SiGe: C 250GHz HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Diop; N. Revil; M. Marin; F. Monsieur; T. Schwartzmann; G. Ghibaudo
Year: 2008
Quantitative reliability assessment of Plasma Induced Damage on product wafers with fast WLR measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Martin; C. Bukethal; K.-H. Ryden; S. Baier; M. Schwerd
Year: 2008
The Effect of the Subthreshold Slope Degradation on NBTI Device Characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Brisbin; P. Chaparala
Year: 2008
Reliability Guard Band Reduction by Differential Targeting of pMOS Gate Oxide Thickness
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Geilenkeuser; K. Wieczorek; M. Trentzsch; F. Graetsch; B. Bayha; V. Samohvalov; T. Paetzold; T. Schink
Year: 2008
The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Campbell; J. Qin; K.P. Cheungl; L. Yu; J.S. Suehlel; A. Oates; K. Sheng
Year: 2008
Repeatability and Stress Level Dependence on ESD-CDM Testing for Microelectronic Components
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Satirakul; T. Butngam; S. Phunyapinuant
Year: 2008
Concept and implementation of an in-situ test structure for HTGS reliability testing of PowerFETs on a wafer level basis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Baier
Year: 2008
Fully Automatical Test and Qualification System for a High Endurance Embedded EEPROM Module
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Fellner; G. Schatzberger; A. Wiesner
Year: 2008
A Robust Single Event Upset Hardened Clock Distribution Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Mallajosyula; P. Zarkesh-Ha
Year: 2008
Reliability Simulation and Design Consideration of High Speed ADC Circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Baoguang Yan; Jin Qin; Jun Dai; Qingguo Fan; J.B. Bernstein
Year: 2008
An Electrically-Detected Magnetic Resonance Study of the Atomic-Scale Effects of Fluorine on the Negative Bias Temperature Instability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.T. Ryan; P.M. Lenahan; A.T. Krishnan; S. Krishnan; J.P. Campbell
Year: 2008
Oxide Reliability of SiC MOS Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Liangchun Yu; K.P. Cheung; J. Campbell; J.S. Suehle; Kuang Sheng
Year: 2008
Discussion Group (DG) summary: NVM Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guoqiao Tao; Peter J O'Shea
Year: 2008
The effect of recovery on NBTI characterization of thick non-nitrided oxides
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Reisinger; R.P. Vollertsen; P.J. Wagner; S. Aresu; W. Gustin; T. Grasser; C. Schlunder
Year: 2008
Advanced On-The-Fly Method with Correction of Initial Values to Characterize Negative Bias Temperature Instability Reliability (NBTI)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Christelle Benard; Jean-Luc Ogier; Didier Goguenheim
Year: 2008
Copper line topology impact of SiOCH low-k dielectric reliability in advanced 45nm technology node and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Vilmay; D. Roy; C. Monget; F. Volpi; J-M. Chaix
Year: 2008
Impact of Oxygen Vacancies Profile and Fringe Effect on Leakage Current Instability of Ta2O5 MIM Capacitors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Martinez; C. Besset; F. Monsieur; L. Montes; G. Ghibaudo
Year: 2008
Stress Characterization for Stress-Induced Voiding in Cu/Low K Interconnects with Geometry and Upper Cap Layer Dependences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mingte Lin; James W. Liang; K. C. Su
Year: 2008
Ageing under illumination of MOS transistors for active pixel sensors (APS) applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Diana Lopez; Frederic Monsieur; Francis Balestra
Year: 2008
Investigation of GIDL current Injection Disturb Mechanism in two-transistor-eNVM memory devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung-Rae Kim; K. J. Han; Junmin Lee; P. Y. Lee; Tony Zhou; Kin-Sing Lee; Patty Liu; Huan-Chung Tseng; Brian Cronguist
Year: 2008
Effect of substrate hot carrier stress on high-k gate stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Park; G. Bersuker; C. Y. Kang; C. Young; H-H Tseng; R. Jammy
Year: 2008
Positive Bias Temperature Instability Effects in advanced High-k / Metal Gate NMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dimitris P. Ioannou; Steve Mittl; Giuseppe LaRosa
Year: 2008
Breakdown mechanism for the thin EOT Dy2O3/HfO2 dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tackhwi Lee; S. Park; Jack Lee; Sanjay K. Banerjee
Year: 2008
Geometry effects on the NBTI degradation of PMOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gaetan Math; Christelle Benard; Jean-Luc Ogier; Didier Goguenheim
Year: 2008
Interface Traps in Silicon Carbide MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.J. Cochrane; P. M. Lenahan; A.J. Lelis
Year: 2008
Effect of Threshold-Voltage Instability on SiC DMOSFET Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Aivars Lelis; D. Habersat; R. Green; N. Goldsman
Year: 2008
Coupled Approach for Reliability Study of Fully Self Aligned SiGe:C 250GHz HBTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Diop; N. Revil; M. Marin; F. Monsieur; T. Schwartzmann; G. Ghibaudo
Year: 2008
Quantitative reliability assessment of Plasma Induced Damage on product wafers with fast WLR measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Andreas Martin; Christoph Bukethal; Karl-Henrik Ryden; Sascha Baier; Markus Schwerd
Year: 2008
The Effect of the Subthreshold Slope Degradation on NBTI Device Characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Brisbin; P. Chaparala
Year: 2008
The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.P. Campbell; J. Qin; K.P. Cheung; L. Yu; J.S. Suehle; A. Oates; K. Sheng
Year: 2008
Circuit Failure Prediction for Robust System Design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Subhasish Mitra
Year: 2008
Towards Understanding Negative Bias Temperature Instability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tibor Grasser
Year: 2008
eFuse Design and Reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.R. Tonti
Year: 2008
JEDEC - Tutorial; Everything you wanted to know But were afraid to ask
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Alvin Strong
Year: 2008
A Randomized Pay-as-Bid Mechanism for Grid Resource Allocation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Stosser
Year: 2008
Password Management for EPC Class 1 Generation 2 Transponders
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Wonnemann; J. Struker
Year: 2008
On Providing One-to-One Marketing with Customers' Privacy in Stationary Retail
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Struker; R. Accorsi; G. Muller
Year: 2008
Multi-attribute Inter-enterprise Exchange of Logistics Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Gujo
Year: 2008
Needs-Centric Searching and Ranking Based on Customer Reviews
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.Y. Lee; S. Li; Ran Wei
Year: 2008
Price Trust Evaluation in E-service Oriented Applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan Wang; Lei Li; Ee-Peng Lim
Year: 2008
A Dynamic Capability Framework for Context-Aware Mobile Services
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chin-Chih Chang; J.C.R. Tseng; Kwei-Jay Lin
Year: 2008
Use of Content Tags in Managing Advertisements for Online Videos
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chia-Hsin Huang; H.T. Kung; Chia-Yung Su
Year: 2008
Reactivity in Online Auctions: Understanding Bidding Behavior through Reactive Transitions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Pereira; L. Rocha; F. Mourao; W. Meira; P. Goes
Year: 2008
License-Aware Service Selection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.R. Gangadharan; M. Comerio; Hong-Linh Truong; V. D'Andrea; F. De Paoli; S. Dustdar
Year: 2008
Designing Support Systems for Applications Outsourcing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I.T. Hawryszkiewycz
Year: 2008
Automatic Service Composition Using AND/OR Graph
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yixin Yan; Bin Xu; Zhifeng Gu
Year: 2008
Customizable Business Process Composition with Query Optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Raman; Yue Zhang; M. Panahi; Kwei-Jay Lin
Year: 2008
Customizable Search Engine with Semantic and Resource Aggregation Capability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Movva; R. Ramachandran; S. Graves; H. Conover
Year: 2008
How to Describe Workflow Information Systems to Support Business Process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.G. Garcia; J. Vanderdonckt; C. Lemaige; J.M.G. Calleros
Year: 2008
The Social Service Network - Web 2.0 Can Make Semantic Web Services Happen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. El-Goarany; I. Saleh; G. Kulczycki
Year: 2008
A SOA-Driven Content Discovery and Retrieval Platform
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Mitchell; M.B. Blake; D. Cunningham; S. Gopalan
Year: 2008
Securing Enterprise Applications: Service-Oriented Security (SOS)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Farkas; M.N. Huhns
Year: 2008
Semantic Foraging in Defined Contexts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Carmichael; B. Swart
Year: 2008
A clsss of adaptive robust state observers of uncertain nonlinear time-delay systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hansheng Wu
Year: 2008
Improved delay-dependent robust H filtering of continuous-time polytopic linear systems with time-varying delay
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianbin Qiu; Gang Feng; Jie Yang
Year: 2008
A survey on pinning control of complex dynamical networks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan-Wu Wang; Changyun Wen
Year: 2008
Brushless DC motor control using bit-streams
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Patel; U. Madawala
Year: 2008
A novel algorithm for unknown periodic disturbance cancellation in HDDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hui Li; Chunling Du; Youyi Wang
Year: 2008
Using spherical moments for visual servoing from a special target with unique projection center cameras
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.T. Fomena; F. Chaumette
Year: 2008
Combinning linear vestibulo-ocular and opto-kinetic reflex in a humanoid robot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Labutov; R. Kaushik; M. Marcinkiewicz; Jizhong Xiao; S. Parsons; T. Raphan
Year: 2008
Study of a double two-phase induction motor drive system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bulai Wang; T.A. Lipo; G. Wei; Jianxin Chu
Year: 2008
Error analysis in strapdown INS for aircraft assembly lines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Gomez-Estern; F. Gordillo
Year: 2008
EMG-moment model of human arm for rehabilitation robot system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Duong Minh Duc; T. Kazuhiko; M. Takanori
Year: 2008
Formation tracking control of mobile robots with limited sensing and without velocity measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.D. Do
Year: 2008
Localization of mobile transmitters by means of linear state estimation using RSS measurements
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P.N. Pathirana; A.N. Bishop; A.V. Savkin
Year: 2008
Networked biological system by wireless sensors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Marino; F.P. Fontan; M.A. Dominguez; S. Otero
Year: 2008
Action/perception-oriented robot software design: An application in off-road terrain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Schafer; M. Proetzsch; K. Berns
Year: 2008
New results in decentralized adaptive backstepping stabilization of nonlinear interconnected systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wei Wang; Changyun Wen; Jing Zhou
Year: 2008
Efficient visual memory based navigation of indoor robot with a wide-field of view camera
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Courbon; Y. Mezouar; L. Eck; P. Martinet
Year: 2008
A robust slip estimation method for skid-steered mobile robots
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaojing Song; L.D. Seneviratne; K. Althoefer; Zibin Song
Year: 2008
From operational to tactical driving: A hybrid learning approach for autonomous vehicles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tran Xuan Phuoc Diem; M. Pasquier
Year: 2008
Digital wide range electronic speed governor on FPGA
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ning Xiao; Kai Shuang; Deguo Wang; Guanmin Liu
Year: 2008
Some conclusions on the controllability of linear systems over F(z) in frequency domain
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Guan-Min Liu; Kai-Sheng Lu; Ning Xiao
Year: 2008
Visual topological mapping and localisation using colour histograms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Werner; J. Sitte; F. Maire
Year: 2008
Detecting spurious features using parity space
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Tornqvist; T.B. Schon; F. Gustafsson
Year: 2008
SLAM process using Polynomial Extended Kalman Filter: Experimental assessment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Chanier; P. Checchin; C. Blanc; L. Trassoudaine
Year: 2008
Location of iris based on circular and linear filters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. van Huan; N. Binh; H. Kim
Year: 2008
Illuminated face normalization technique by using wavelet fusion and local binary patterns
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.B.J. Teoh; Y.Z. Goh; M. Goh
Year: 2008
Battery state-of-charge estimation based on H filter for hybrid electric vehicle
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jingyu Yan; Guoqing Xu; Yangsheng Xu; Benliang Xie
Year: 2008
Identification of initial rotor position of a micro-PMSM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Zhang; Ningning Wu
Year: 2008
Model-Based Networked Control System stability based on packet drop distributions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Lanzhi Teng; Peng Wen; Wei Xiang
Year: 2008
Research and improvement of Pre-decode pattern matching circuit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Tian; SuYing Yao
Year: 2008
Coordination strategies for networked control systems: A power system application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Casavola; G. Franze
Year: 2008
Computing the cost of multiplexed MPC
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.V. Ling; J.M. Maciejowski; B.F. Wu
Year: 2008
Robotic motion compensation for beating intracardiac surgery
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.G. Yuen; D.T. Kettler; R.D. Howe
Year: 2008
Automatic building detection in aerial and satellite images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Saeedi; H. Zwick
Year: 2008
A clustering method by code vectors considering attractive and repulsive force based on maximum distance of k neighbors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Imamura; M. Fujimura; H. Kuroda
Year: 2008
A coupled implicit shape-based deformable model for segmentation of MR images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Farzinfar; Eam Khwang Teoh; Zhong Xue
Year: 2008
Image clustering by incorporating adaptive spatial connectivity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhimin Wang; Qing Song; Yeng Chai Soh; Kang Sim
Year: 2008
Performance evaluation of re-acquisition methods for public transport surveillance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Leung; J. Orwell; S.A. Velastin
Year: 2008
On intelligent surveillance systems and face recognition for mass transport security
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.C. Lovell; S. Chen; A. Bigdeli; E. Berglund; C. Sanderson
Year: 2008
Pedestrian detection for mobile bus surveillance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W.S. Leoputra; S. Venkatesh; Tele Tan
Year: 2008
Multirate iterative learning control schemes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Bin Zhang; Danwei Wang; Yongqiang Ye; Yigang Wang; Keliang Zhou
Year: 2008
Recognition technique for character cube stacking robot
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chyi-Yeu Lin; Chia-Lun Hsueh
Year: 2008
Log-Polar transform in 3D environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Nakata; Yue Bao
Year: 2008
Non-commutative determinants in nonlinear control theory: Preliminary ideas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:U. Kotta; A. Leibak; M. Halas
Year: 2008
Multi-scale image contrast enhancement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Vonikakis; I. Andreadis
Year: 2008
Image processing of particle detection for asbestos qualitative analysis support method -Particle counting system based on classification of background area-
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ishizu; H. Takemura; K. Kawabata; H. Asama; T. Mishima; H. Mizoguchi
Year: 2008
An approach of canny edge detection with virtual hexagonal image structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiangjian He; Wenjing Jia; Qiang Wu
Year: 2008
A new Pixel-Chaotic-Shuffle method for image encryption
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.H. Nien; S.K. Changchien; S.Y. Wu; C.K. Huang
Year: 2008
Ant colony optimization and mutual information hybrid algorithms for feature subset selection in equipment fault diagnosis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Junhong Zhou; Ruisheng Ng; Xiang Li
Year: 2008
A systematic topological method for fingerprint singular point detection
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.K. Lam; Z. Hou; W.Y. Yau; T.P. Chen; J. Li
Year: 2008
Delay-dependent stability analysis for Two- Dimensional discrete systems with shift delays by the General Models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shuxia Ye; Yun Zou; Weiqun Wang; Juan Yao
Year: 2008
New smith predictor control using disturbance observer for steam superheater and steam pressure of the boiler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Soonyoung Lee; Yonghwan Shin; Eunsung Jang; Hwi-Beom Shin
Year: 2008
Design of sliding mode functional observers for time-delay systems of neutral type
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Alahakoon; T. Fernando; N. Nikraz
Year: 2008
Optimal vibration control for active suspension sampled-data systems with actuator and sensor delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Lei; Gong-You Tang
Year: 2008
Relaxed delay-dependent stabilization conditions for discrete-time fuzzy systems with time delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung Hyun Kim; Chang Hee Lee; PooGyeon Park
Year: 2008
Sliding mode functional observers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fernando; V. Sreeram; B. Bandyopadhyay
Year: 2008
A new hybrid filter for power quality improvement in unbalanced load conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Dalvand; M.T. Nguyen; N.M. Kwok; Q.P. Ha
Year: 2008
Modular design of adaptive controller for strict-feedback stochastic nonlinear systems with uncertain Wiener noise
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jun Wang; Tao Cai; Yu Kang
Year: 2008
A dynamic trust evaluation algorithm based on subjective logic in pervasive computing environment
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan Yang; Liang He; Xueming Cai
Year: 2008
Modelling air-pollution problem by Cellular Neural Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vu Duc Thai; Pham Thuong Cat
Year: 2008
Model reference control of nonlinear systems by dynamic output feedback linearization of neural network based ANARX models
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Petlenkov
Year: 2008
Real-time reconstruction of symmetrical image using Cellular Neural Network
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pham Duc Long; Pham Thuong Cat
Year: 2008
Incorporating user quality for performance improvement in hand identification
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Kumar; D. Zhang
Year: 2008
Decentralized fault diagnosis system using ICA in a complex chemical process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Akhlaghi; A.R. Kashanipour; K. Salahshoor
Year: 2008
An improved Markov-based localization approach by using image quality evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.A. Gamez; I. Garcia-Varea; J. Martinez-Gomez
Year: 2008
Performance testing of a 2 Loop RLC WM inverter-fed induction motor drive
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.A. Saleh; M.A. Rahman
Year: 2008
Clutter-aware dynamic projection system using a handheld projector
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Siriborvornratanakul; M. Sugimoto
Year: 2008
A model driven 3D lane detection system using stereovision
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Benmansour; R. Labayrade; D. Aubert; S. Glaser; D. Gruyer
Year: 2008
Video object error coding method based on compressive sensing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Honglin Huang; A. Makur; D. Venkatraman
Year: 2008
Detecting local features in complex images: A combination of Hough transform and moment-based approximations
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Sluzek
Year: 2008
Palmprint identification using Sobel operator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K.Y.Edward. Wong; A. Chekima; J.A. Dargham; G. Sainarayanan
Year: 2008
Evaluation methodology for analyzing environment influence in biometrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Fernandez-Saavedra; R. Sanchez-Reillo; R. Alonso-Moreno; R. Mueller
Year: 2008
A large scale footstep database for biometric studies created using cross-biometrics for labelling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Vera-Rodriguez; R.P. Lewis; J.S.D. Mason; N.W.D. Evans
Year: 2008
Harmonic control based on Hadamard product LMI approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xinjin Liu; Yun Zou
Year: 2008
Robust controller design for networked control systems with uncertain time delays
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Salehi; Lihua Xie; Wenjian Cai
Year: 2008
Trinocular matching realized by a monocular stereovision sensor for parallel manipulator
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuang-rong Hao; Yong-sheng Ding
Year: 2008
A frequency response parametrization of all stabilizing controllers for discrete time systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L.H. Keel; S.P. Bhattacharyya
Year: 2008
Robust stability of delay systems with rank-one uncertainty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Yu; Yongyong Li
Year: 2008
Observer-based robust reliable H control for uncertain time-delay discrete-time systems in the presence of sensor failure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu Wang; Fenghuang Cai; Fujun Cui; Fuwen Yang
Year: 2008
Multiobjective fixed-order controllers for MIMO systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Qiongbin Lin; Fuwen Yang
Year: 2008
Using dynamic programming to match human behavior sequences
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yan Chen; Qiang Wu; Xiangjian He
Year: 2008
Particle swarm based stereo algorithm and disparity map evaluation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhang Haofeng; Zhao Chunxia; Tang Zhenmin; Yang Jingyu
Year: 2008
Stereo vision based intuitive posture input system using a portable color marked puppet
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jae Byung Park
Year: 2008
Home environment fall detection system based on a cascaded multi-SVM classifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huimin Qian; Yaobin Mao; Wenbo Xiang; Zhiquan Wang
Year: 2008
PID-Neural controller based on AVR Atmega128
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xuan Khanh Pham; Doan Que Anh Vo; Ngoc Hai Nguyen; The Phong Cao
Year: 2008
Reversible watermarking with localization for biometric images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hyobin Lee; Seongwan Kim; Jaeho Lee; Sooyeon Kim; Sangyoun Lee
Year: 2008
An approach to protect Private Key using fingerprint Biometric Encryption Key in BioPKI based security system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Nguyen Thi Hoang Lan; Nguyen Thi Thu Hang
Year: 2008
Sensorless speed control of a permanent magnet type axial gap self-bearing motor using sliding mode observer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Dich Quang Nguyen; S. Ueno
Year: 2008
Optimal control for a distributed parameter system with time delay based on the numerical method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cong Nguyen Huu; Nam Nguyen Hoai
Year: 2008
Knowledge-based role allocation in robot soccer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Playne
Year: 2008
Research on water quality assessment method based on multi-class support vector machines
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Cao Jian; Hu Hongsheng; Qian Suxiang; Gu Xiaojun
Year: 2008
Fault diagnosis of circuit board based on fault tree
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Pan Hongxia; Huang Jinying; Liu Guangmin
Year: 2008
Using blending control to suppress multi-frequency disturbances
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chunling Du; Lihua Xie; F.L. Lewis
Year: 2008
Cooperative navigation using the optical flow and time-to-contact techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Nebot; E. Cervera
Year: 2008
Application of blind system identification in acoustic source location
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin Yang; Yumei Wen; Ping Li
Year: 2008
MRI image segmentation based on fast global minimization of snake model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T.-T. Tran; Po-Lei Lee; V.-T. Pham; Kuo-Kai Shyu
Year: 2008
Instrumentation and experiment design for in-vitro interface temperature measurement during the insertion of an orthopaedic implant
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:W. Xu
Year: 2008
System for estimating sclerosis of in vivo arteries based on ultrasound B-mode image analysis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Nogata; Y. Yokota; Y. Kawamura; W.R. Walsh
Year: 2008
Adaptive filter for speckle reduction with feature preservation in medical ultrasound images
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Rui; Sun Zhuoxin; Zhang Cishen
Year: 2008
Optimal robust prediction for general discrete time singular systems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.F. Bianco; J.Y. Ishihara; M.H. Terra
Year: 2008
On observer-based structures of descriptor compensators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Yagoubi; P. Chevrel; A. Bouali
Year: 2008
Opto-tactile sensor for surface texture pattern identification using support vector machine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.M. Mazid; A. Ali
Year: 2008
A stream field based partially observable moving object tracking algorithm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Kuo-Shih Tseng
Year: 2008
A new algorithm for calibrating a combined camera and IMU sensor unit
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.D. Hol; T.B. Schon; F. Gustafsson
Year: 2008
The random weighting estimation and its convergence of population parameter for two poisson distribution
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yu-Ren Li; She-Sheng Gao; Pan Hu
Year: 2008
A multiclass classifier using Genetic Programming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N.S. Chaudhari; A. Purohit; A. Tiwari
Year: 2008
Implementation of TFT inspection system using the common unified device architecture (CUDA) on modern graphics hardware
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chang Hee Lee; Changki Jeong; Moonsoo Chang; PooGyeon Park
Year: 2008
A vision-based approach for surface roughness assessment at micro and nano scales
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.A. Al-Kindi; B. Shirinzadeh; Yongmin Zhong
Year: 2008
A Study on artificial immune network based on multilevel flow model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhao Yun; Yin Yunhui; Wang Bin; Qian Suxiang
Year: 2008
An ultrasonic imaging guided medical robot system for microwave ablation therapy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jiang Lipei; Deng Shuangcheng; Xue Long; Cao Yingyu; Cao Junfang; Cai Xiaoyun; Liu Xiangchen
Year: 2008
A mobile robot with a inter-integrated circuit system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Panich
Year: 2008
Research of hybrid intelligent control for incubation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wu Shu-ci; Zhou Guo-xiong; Yan Mi-ying; Zhou Kai; Zheng Rui-ling
Year: 2008
Modified feedback configuration for sensor fault tolerant control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Yang; E.C. Mid; H.A.F. Mohamed; M. Moghavvemi; J. Chen
Year: 2008
A generalized controller reduction technique using LFT framework
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Houlis; V. Sreeram
Year: 2008
An improved frequency weighted balancing related technique with error bounds
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V. Sreeram; S. Sahlan
Year: 2008
Multi-sensor image fusion with ICA bases and region rule
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Meng Wang; Jian Yang
Year: 2008
A multi-processed salient point detection system for autonomous navigation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:V.A. Nguyen; A.T.L. Phuan
Year: 2008
Hand movement detection using monocular camera for robot cooperation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fujita
Year: 2008
Calculation of the control signal in MIMO NN-based ANARX models: Analytical approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Belikov; E. Petlenkov
Year: 2008
Mobile load management system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Hung Wu; Yu-Wei Huang; Deng-Chung Lin
Year: 2008
Enlarging region of attraction in input-output linearization method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Barkhordari; M.R.J. Motlagh; M. Keshavarz
Year: 2008
Transducer positioning system with sights of multiple optical beams for target strength measurements of marine organisms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Ishii; K. Sawada
Year: 2008
Dynamically reconfigurable FPGA for robotics control
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Erdogan; T. Shaneyfelt; Geok See Ng; A. Wahab
Year: 2008
Force and motion control for cylindrical curved surface wall using a three-link arm
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Yoshida; D. Hayashi
Year: 2008
Mixed H2/H filtering for polytopic discrete-time systems with parameter dependent lyapunov functions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Hui; Wang Tianshu; Zhang Tao; Song Jingyan
Year: 2008
Existence of real roots for the family of interval polynomials
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xin Yu; Ya Li
Year: 2008
Lane boundaries detection algorithm using vector lane concept
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Quoc Bao Truong; Byung Ryong Lee; Nam Geon Heo; Young Jim Yum; Jong Gook Kim
Year: 2008
Session 1: Plenary
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ralf Brederlow
Year: 2008
Electronic and ionic devices: Semiconductor chips with brain tissue
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Fromherz
Year: 2008
Session 2: Process technology — high-k metal-gate integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Luigi Colombo; Yoshi Tsuchiya
Year: 2008
Intrinsic correlation between mobility reduction and Vt shift due to interface dipole modulation in HfSiON/SiO2 stack by La or Al addition
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Tatsumura; T. Ishihara; S. Inumiya; K. Nakajima; A. Kaneko; M. Goto; S. Kawanaka; A. Kinoshita
Year: 2008
Manipulating interface dipoles of opposing polarity for work function engineering within a single metal gate stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Eu-Jin Lim; Jian Hou; Dim-Lee Kwong; Yee-Chia Yeo
Year: 2008
Systematic Study of Vth controllability using ALD-Y2O3, La2O3, and MgO2 layers with HfSiON/metal gate first n-MOSFETs for hp 32 nm bulk devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kamiyama; D. Ishikawa; E. Kurosawa; H. Nakata; M. Kitajima; M. Ootuka; T. Aoyama; Y. Nara; Y. Ohji
Year: 2008
Device and reliability improvement of HfSiON+LaOx/metal gate stacks for 22nm node application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Huang; P.D. Kirsch; D. Heh; C.Y. Kang; G. Bersuker; M. Hussain; P. Majhi; P. Sivasubramani; D.C. Gilmer; N. Goel; M.A. Quevedo-Lopez; C. Young; C.S. Park; C. Park; P.Y. Hung; J. Price; H.R. Harris; B.H. Lee; H.-H. Tseng; R. Jammy
Year: 2008
Session 3: CMOS devices and technology — advanced transport enhancement
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Year: 2008
High-performance nMOSFET with in-situ phosphorus-doped embedded Si:C (ISPD eSi:C) source-drain stressor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Yang; R. Takalkar; Z. Ren; L. Black; A. Dube; J.W. Weijtmans; J. Li; J.B. Johnson; J. Faltermeier; A. Madan; Z. Zhu; A. Turansky; G. Xia; A. Chakravarti; R. Pal; K. Chan; A. Reznicek; T.N. Adam; B. Yang; J.P. de Souza; E.C.T. Harley; B. Greene; A. Gehring; M. Cai; D. Aime; S. Sun; H. Meer; J. Holt; D. Theodore; S. Zollner; P. Grudowski; D. Sadana; D.-G. Park; D. Mocuta; D. Schepis; E. Maciejewski; S. Luning; J. Pellerin; E. Leobandung
Year: 2008
Physical and electrical analysis of the stress memorization technique (SMT) using poly-gates and its optimization for beyond 45-nm high-performance applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Miyashita; T. Owada; A. Hatada; Y. Hayami; K. Ookoshi; T. Mori; H. Kurata; T. Futatsugi
Year: 2008
(110) NMOSFETs competitive to (001) NMOSFETs: Si migration to create (331) facet and ultra-shallow Al implantation after NiSi formation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Fukutome; K. Okabe; K. Okubo; H. Minakata; Y. Morisaki; K. Ikeda; T. Yamamoto; K. Hosaka; Y. Momiyama; M. Kase; S. Satoh
Year: 2008
High performance Hi-K + metal gate strain enhanced transistors on (110) silicon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Packan; S. Cea; H. Deshpande; T. Ghani; M. Giles; O. Golonzka; M. Hattendorf; R. Kotlyar; K. Kuhn; A. Murthy; P. Ranade; L. Shifren; C. Weber; K. Zawadzki
Year: 2008
Experimental investigation on the origin of direction dependence of Si (110) hole mobility utilizing ultra-thin body pMOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Shimizu; T. Saraya; T. Hiramoto
Year: 2008
Session 4: Displays, sensors, and MEMS — thin-film devices and memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Mutsuko Hatano; David Redinger
Year: 2008
High performance oxide thin film transistors with double active layers
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sun Il Kim; Chang Jung Kim; Jae Chul Park; Ihun Song; Sang Wook Kim; Huaxiang Yin; Eunha Lee; Jae Chul Lee; Youngsoo Park
Year: 2008
1.5-V Operating fully-depleted amorphous oxide thin film transistors achieved by 63-mV/dec subthreshold slope
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kawamura; H. Uchiyama; S. Saito; H. Wakana; T. Mine; M. Hatano; K. Torii; T. Onai
Year: 2008
Bootstrapped ring oscillator with propagation delay time below 1.0 nsec/stage by standard 0.5µm bottom-gate amorphous Ga2O3-In2O3-ZnO TFT technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Huaxiang Yin; Sunil Kim; Chang Jung Kim; Jae Chul Park; Ihun Song; Sang-Wook Kim; Sung-Hoon Lee; Youngsoo Park
Year: 2008
Stack friendly all-oxide 3D RRAM using GaInZnO peripheral TFT realized over glass substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.-J. Lee; C.B. Lee; S. Kim; H. Yin; J. Park; S.E. Ahn; B.S. Kang; K.H. Kim; G. Stefanovich; I. Song; S.W. Kim; J.H. Lee; S.J. Chung; Y.H. Kim; C.S. Lee; J.B. Park; I.G. Baek; C.J. Kim; Y. Park
Year: 2008
Amorphous silicon thin-film transistors with DC saturation current half-life of more than 100 years
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Hekmatshoar; K.H. Cherenack; S. Wagner; J.C. Sturm
Year: 2008
Ultra-High Frequency rectification using organic diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Steudel; K. Myny; P. Vicca; D. Cheyns; J. Genoe; P. Heremans
Year: 2008
Session 5: Characterization, reliability, and yield BTI in SiON and high k FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sufi Zafar; Gennadi Bersuker
Year: 2008
A comprehensive study of flicker noise in plasma nitrided SiON p-MOSFETs: process dependence of pre-existing and NBTI stress generated trap distribution profiles
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Kapila; N. Goyal; V.D. Maheta; C. Olsen; K. Ahmed; S. Mahapatra
Year: 2008
A comprehensive and comparative study of interface and bulk characteristics of nMOSETs with la-incorporated high-k dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Won-Ho Choi; Hyuk-Min Kwon; In-Shik Han; Tae-Gyu Goo; Min-Ki Na; Chang Yong Kang; Gennadi Bersuker; Byoung Hun Lee; Yoon-Ha Jeong; Hi-Deok Lee; R. Jammy
Year: 2008
The impact of la-doping on the reliability of low Vth high-k/metal gate nMOSFETs under various gate stress conditions
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.Y. Kang; C.D. Young; J. Huang; P. Kirsch; D. Heh; P. Sivasubramani; H.K. Park; G. Bersuker; B.H. Lee; H.S. Choi; K.T. Lee; Y.-H. Jeong; J. Lichtenwalner; A.I. Kingon; H.-H. Tseng; R. Jammy
Year: 2008
Physical model of the PBTI and TDDB of la incorporated HfSiON gate dielectrics with pre-existing and stress-induced defects
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sato; N. Umezawa; J. Shimokawa; H. Arimura; S. Sugino; A. Tachibana; M. Nakamura; N. Mise; S. Kamiyama; T. Morooka; T. Eimori; K. Shiraishi; K. Yamabe; H. Watanabe; K. Yamada; T. Aoyama; T. Nabatame; Y. Nara; Y. Ohji
Year: 2008
Session 6: Quantum, power, and compound semiconductors devices - high-voltage power devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Tomas Palacios; Florin Udrea
Year: 2008
Rugged Dotted-channel LDMOS structure
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Khan; V. Khemka; Ronghua Zhu; A. Bose
Year: 2008
190V N-channel lateral IGBT integration in SOI 0.35 µm BCD technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sambi; M. Gallo; P. Galbiati
Year: 2008
High voltage devices integration into advanced CMOS technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R.A. Bianchi; F. Monsieur; F. Blanchet; C. Raynaud; O. Noblanc
Year: 2008
Monolithic integration of lateral field-effect rectifier with normally-off HEMT for GaN-on-Si switch-mode power supply converters
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Wanjun Chen; King-Yuen Wong; K.J. Chen
Year: 2008
GaN-based natural super junction diodes with multi-channel structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Ishida; D. Shibata; H. Matsuo; M. Yanagihara; Y. Uemoto; T. Ueda; T. Tanaka; D. Ueda
Year: 2008
Source injection induced off-state breakdown and its improvement by enhanced back barrier with fluorine ion implantation in AlGaN/GaN HEMTs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Maojun Wang; K.J. Chen
Year: 2008
Session 7: Solid-state and nanoelectronic devices - spin devices, batteries and steep slope FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Franz Kreupl; Jing Guo
Year: 2008
Engineering single spins and coherence for spintronics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.D. Awschalom
Year: 2008
Impact of SOI, Si1-xGexOI and GeOI substrates on CMOS compatible Tunnel FET performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Mayer; C. Le Royer; J.-F. Damlencourt; K. Romanjek; F. Andrieu; C. Tabone; B. Previtali; S. Deleonibus
Year: 2008
Demonstration of subthrehold swing smaller than 60mV/decade in Fe-FET with P(VDF-TrFE)/SiO2 gate stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G.A. Salvatore; D. Bouvet; A.M. Ionescu
Year: 2008
Feedback FET: A novel transistor exhibiting steep switching behavior at low bias voltages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Padilla; Chun Wing Yeung; Changhwan Shin; Chenming Hu; Tsu-Jae King Liu
Year: 2008
A novel SPRAM (SPin-transfer torque RAM)-based reconfigurable logic block for 3D-stacked reconfigurable spin processor
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Sekikawa; K. Kiyoyama; H. Hasegawa; K. Miura; T. Fukushima; S. Ikeda; T. Tanaka; H. Ohno; M. Koyanagi
Year: 2008
Session 8: Modeling and simulation - advances in modeling low dimensional structures
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Giuseppe Iannaccone
Year: 2008
Shot noise in quasi one-dimensional FETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Betti; G. Fiori; G. Iannaccone
Year: 2008
The quantum capacitance limit of high-speed, low-power InSb nanowire field effect transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M.A. Khayer; R.K. Lake
Year: 2008
Graphene nano-ribbon (GNR) interconnects: A genuine contender or a delusive dream?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chuan Xu; Hong Li; K. Banerjee
Year: 2008
Session 9: Memory technology — phase-change and unified memory
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Daniele Ielmini
Year: 2008
Transient effects of delay, switching and recovery in phase change memory (PCM) devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Lavizzari; D. Ielmini; D. Sharma; A.L. Lacaita
Year: 2008
High speed Flash Memory and 1T-DRAM on dopant segregated Schottky barrier (DSSB) FinFET SONOS device for multi-functional SoC applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Sung-Jin Choi; Jin-Woo Han; Sungho Kim; Dong-Hyun Kim; Moon-Gyu Jang; Jong-Heon Yang; Jin Soo Kim; Kwang Hee Kim; Gi Sung Lee; Jae Sub Oh; Myeong Ho Song; Yun Chang Park; Jeoung Woo Kim; Yang-Kyu Choi
Year: 2008
Energy band engineered unified-RAM (URAM) for multi-functioning 1T-DRAM and NVM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Woo Han; Seong-Wan Ryu; Sungho Kim; Chung-Jin Kim; Jae-Hyuk Ahn; Sung-Jin Choi; Kyu Jin Choi; Byung Jin Cho; Jin Soo Kim; Kwang Hee Kim; Gi Sung Lee; Jae Sub Oh; Myong Ho Song; Yun Chang Park; Jeoung Woo Kim; Yang-Kyu Choi
Year: 2008
Session 10: CMOS devices and technology - Vth variation and scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Olivier Faynot; Eddie Breashears
Year: 2008
Scaling of 32nm low power SRAM with high-K metal gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.S. Yang; R. Wong; R. Hasumi; Y. Gao; N.S. Kim; D.H. Lee; S. Badrudduza; D. Nair; M. Ostermayr; H. Kang; H. Zhuang; J. Li; L. Kang; X. Chen; A. Thean; F. Arnaud; L. Zhuang; C. Schiller; D.P. Sun; Y.W. Teh; J. Wallner; Y. Takasu; K. Stein; S. Samavedam; D. Jaeger; C.V. Baiocco; M. Sherony; M. Khare; C. Lage; J. Pape; J. Sudijono; A.L. Steegen; S. Stiffler
Year: 2008
Demonstration of highly scaled FinFET SRAM cells with high-κ/metal gate and investigation of characteristic variability for the 32 nm node and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Kawasaki; M. Khater; M. Guillorn; N. Fuller; J. Chang; S. Kanakasabapathy; L. Chang; R. Muralidhar; K. Babich; Q. Yang; J. Ott; D. Klaus; E. Kratschmer; E. Sikorski; R. Miller; R. Viswanathan; Y. Zhang; J. Silverman; Q. Ouyang; A. Yagishita; M. Takayanagi; W. Haensch; K. Ishimaru
Year: 2008
First observation of FinFET specific mismatch behavior and optimization guidelines for SRAM scaling
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Merelle; G. Curatola; A. Nackaerts; N. Collaert; M.J.H. van Dal; G. Doornbos; T.S. Doorn; P. Christie; G. Vellianitis; B. Duriez; R. Duffy; B.J. Pawlak; F.C. Voogt; R. Rooyackers; L. Witters; M. Jurczak; R.J.P. Lander
Year: 2008
High immunity to threshold voltage variability in undoped ultra-thin FDSOI MOSFETs and its physical understanding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Weber; O. Faynot; F. Andrieu; C. Buj-Dufournet; F. Allain; P. Scheiblin; J. Foucher; N. Daval; D. Lafond; L. Tosti; L. Brevard; O. Rozeau; C. Fenouillet-Beranger; M. Marin; F. Boeuf; D. Delprat; K. Bourdelle; B.-Y. Nguyen; S. Deleonibus
Year: 2008
Comprehensive study on vth variability in silicon on Thin BOX (SOTB) CMOS with small random-dopant fluctuation: Finding a way to further reduce variation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sugii; R. Tsuchiya; T. Ishigaki; Y. Morita; H. Yoshimoto; K. Torii; S. Kimura
Year: 2008
MOSFET performance scaling: Limitations and future options
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D.A. Antoniadis; A. Khakifirooz
Year: 2008
Improved effective switching current (IEFF+) and capacitance methodology for CMOS circuit performance prediction and model-to-hardware correlation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Xiaojun Yu; Shu-jen Han; N. Zamdmer; Jie Deng; E.J. Nowak; K. Rim
Year: 2008
Session 11: Displays, sensors, and MEMS - imaging technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Francois Roy; Hiroaki Fujita
Year: 2008
A 36×48mm2 48M-pixel CCD imager for professional DSC applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E.-J.P. Manoury; W. Klaassens; H.C. van Kuijk; L.H. Meessen; A.C. Kleimann; E.W. Bogaart; I.M. Peters; H. Stoldt; M. Koyuncu; J.T. Bosiers
Year: 2008
A high-sensitivity broadband image sensor using CuInGaSe2 thin films
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:O. Matsushima; K. Miyazaki; M. Takaoka; T. Maekawa; H. Sekiguchi; T. Fuchikami; M. Moriwake; H. Takasu; S. Ishizuka; K. Sakurai; A. Yamada; S. Niki
Year: 2008
Setting up 3D sequential integration for back-illuminated CMOS image sensors with highly miniaturized pixels with low temperature fully depleted SOI transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Coudrain; P. Batude; X. Gagnard; C. Leyris; S. Ricq; M. Vinet; A. Pouydebasque; N. Moussy; Y. Cazaux; B. Giffard; P. Magnan; P. Ancey
Year: 2008
Advanced image sensor technology for pixel scaling down toward 1.0µm (Invited)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:JungChak Ahn; Chang-Rok Moon; Bumsuk Kim; Kyungho Lee; Yitae Kim; Moosup Lim; Wook Lee; Heemin Park; Kyoungsik Moon; Jaeryung Yoo; YongJei Lee; ByungJun Park; Sangil Jung; Junetaeg Lee; Tae-Hun Lee; YunKi Lee; Junghoon Jung; Jin-Hak Kim; Tae-Chan Kim; Hyunwoo Cho; Duckhyung Lee; Yonghee Lee
Year: 2008
Wireless-compatible optics-free microarray imager
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Anwar; T. Ayturd; P. Matsudaira
Year: 2008
Highly reliable TaOx ReRAM and direct evidence of redox reaction mechanism
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Z. Wei; Y. Kanzawa; K. Arita; Y. Katoh; K. Kawai; S. Muraoka; S. Mitani; S. Fujii; K. Katayama; M. Iijima; T. Mikawa; T. Ninomiya; R. Miyanaga; Y. Kawashima; K. Tsuji; A. Himeno; T. Okada; R. Azuma; K. Shimakawa; H. Sugaya; T. Takagi; R. Yasuhara; K. Horiba; H. Kumigashira; M. Oshima
Year: 2008
Low power and high speed bipolar switching with a thin reactive Ti buffer layer in robust HfO2 based RRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H.Y. Lee; P.S. Chen; T.Y. Wu; Y.S. Chen; C.C. Wang; P.J. Tzeng; C.H. Lin; F. Chen; C.H. Lien; M.-J. Tsai
Year: 2008
A statistical study of magnetic tunnel junctions for high-density spin torque transfer-MRAM (STT-MRAM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Beach; T. Min; C. Horng; Q. Chen; P. Sherman; S. Le; S. Young; K. Yang; H. Yu; X. Lu; W. Kula; T. Zhong; R. Xiao; A. Zhong; G. Liu; J. Kan; J. Yuan; J. Chen; R. Tong; J. Chien; T. Torng; D. Tang; P. Wang; M. Chen; S. Assefa; M. Qazi; J. DeBrosse; M. Gaidis; S. Kanakasabapathy; Y. Lu; J. Nowak; E. O'Sullivan; T. Maffitt; J.Z. Sun; W.J. Gallagher
Year: 2008
Lower-current and fast switching of a perpendicular TMR for high speed and high density spin-transfer-torque MRAM
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Kishi; H. Yoda; T. Kai; T. Nagase; E. Kitagawa; M. Yoshikawa; K. Nishiyama; T. Daibou; M. Nagamine; M. Amano; S. Takahashi; M. Nakayama; N. Shimomura; H. Aikawa; S. Ikegawa; S. Yuasa; K. Yakushiji; H. Kubota; A. Fukushima; M. Oogane; T. Miyazaki; K. Ando
Year: 2008
Systems design of a high resolution retinal prosthesis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.D. Weiland; W. Fink; M.S. Humayun; Wentai Liu; Wen Li; M. Sivaprakasam; Yu-Chong Tai; M.A. Tarbell
Year: 2008
Design and Integration Technology for Miniature Medical Microsystems
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Van Hoof; H. Neves; A.A.A. Aarts; F. Iker; P. Soussan; M. Gonzalez; E. Beyne; J. Vanfleteren; R.P. Puers; P. De Moor
Year: 2008
Microelectronic neurosensor arrays: Towards implantable brain communication interfaces
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y.-K. Song; D.A. Borton; S. Park; W.R. Patterson; C.W. Bull; J. Mislow; J. Simeral; J.P. Donoghue; A.V. Nurmikko
Year: 2008
Session 14: Characterization, reliability, and yield - ESD/memory reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Harald Gossner; Alessandro Paccagnella
Year: 2008
ESD qualification changes for 45nm and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C. Duvvury
Year: 2008
Impact of Strain on ESD Robustness of FinFET Devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Griffoni; S. Thijs; C. Russ; D. Tremouilles; M. Scholz; D. Linten; N. Collaert; R. Rooyackers; C. Duvvury; H. Gossner; G. Meneghesso; G. Groeseneken
Year: 2008
Guard Ring Interactions and their Effect on CMOS Latchup Resilience
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Farbiz; E. Rosenbaum
Year: 2008
A novel method for evaluating electron/hole mismatch in scaled split-gate SONOS memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Tsuji; M. Terai; S. Fujieda; T. Syo; T. Saito; K. Ando
Year: 2008
Neutron-induced soft errors in advanced flash memories
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:G. Cellere; S. Gerardin; M. Bagatin; A. Paccagnella; A. Visconti; M. Bonanomi; S. Beltrami; P. Roche; G. Gasiot; R. Harboe Sorensen; A. Virtanen; C. Frost; P. Fuochi; C. Andreani; G. Gorini; A. Pietropaolo; S. Platt
Year: 2008
Session 15: Quantum, power, and compound semiconductors devices - III-V MOSFETs with high k dielectrics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Patrick Fay
Year: 2008
Addressing the gate stack challenge for high mobility InxGa1-xAs channels for NFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Goel; D. Heh; S. Koveshnikov; I. Ok; S. Oktyabrsky; V. Tokranov; R. Kambhampatic; M. Yakimov; Y. Sun; P. Pianetta; C.K. Gaspe; M.B. Santos; J. Lee; S. Datta; P. Majhi; W. Tsai
Year: 2008
Scaling of In0.7Ga0.3As buried-channel MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yanning Sun; E.W. Kiewra; J.P. de Souza; J.J. Bucchignano; K.E. Fogel; D.K. Sadana; G.G. Shahidi
Year: 2008
High-performance surface channel In-rich In0.75Ga0.25As MOSFETs with ALD high-k as gate dielectric
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Y. Xuan; T. Shen; M. Xu; Y.Q. Wu; P.D. Ye
Year: 2008
Multi-probe interface characterization of In0.65Ga0.35As/Al2O3 MOSFET
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Varghese; Y. Xuan; Y.Q. Wu; T. Shen; P.D. Ye; M.A. Alam
Year: 2008
A new silane-ammonia surface passivation technology for realizing inversion-type surface-channel GaAs N-MOSFET with 160 nm gate length and high-quality metal-gate/high-k dielectric stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hock-Chun Chin; Ming Zhu; Zhi-Chien Lee; Xinke Liu; Kian-Ming Tan; Hock Koon Lee; Luping Shi; Lei-Jun Tang; Chih-Hang Tung; Guo-Qiang Lo; Leng-Seow Tan; Yee-Chia Yeo
Year: 2008
Session 16: Process technology - Ge-Channel CMOS and advanced gate stacks
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Anand Murthy
Year: 2008
Low temperature (≤ 380°C) and high performance Ge CMOS technology with novel source/drain by metal-induced dopants activation and high-k/metal gate stack for monolithic 3D integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jin-Hong Park; M. Tada; D. Kuzum; P. Kapur; Hyun-Yong Yu; H.-S.P. Wong; K.C. Saraswat
Year: 2008
High mobility high-k/Ge pMOSFETs with 1 nm EOT -New concept on interface engineering and interface characterization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ruilong Xie; Thanh Hoa Phung; Wei He; Zhiqiang Sun; Mingbin Yu; Zhiyuan Cheng; Chunxiang Zhu
Year: 2008
Localized ultra-thin GeOI: An innovative approach to germanium channel MOSFETs on bulk Si substrates
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Batail; S. Monfray; C. Tabone; O. Kermarrec; J.F. Damlencourt; P. Gautier; G. Rabille; C. Arvet; N. Loubet; Y. Campidelli; J.M. Hartmann; A. Pouydebasque; V. Delaye; C. Le Royer; G. Ghibaudo; T. Skotnicki; S. Deleonibus
Year: 2008
Plasma PH3-passivated high mobility inversion InGaAs MOSFET fabricated with self-aligned gate-first process and HfO2/TaN gate stack
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jianqiang Lin; Sungjoo Lee; Hoon-Jung Oh; Weifeng Yang; G.Q. Lo; D.L. Kwong; D.Z. Chi
Year: 2008
Fluorinated HfO2 gate dielectrics engineering for CMOS by pre- and post-CF4 plasma passivation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Woei-Cherng Wu; Chao-Sung Lai; Shih-Ching Lee; Ming-Wen Ma; Tien-Sheng Chao; Jer-Chyi Wang; Chih-Wei Hsu; Pai-Chi Chou; Jian-Hao Chen; Kuo-Hsing Kao; Wen-Cheng Lo; Tsung-Yi Lu; Li-Lin Tay; N. Rowell
Year: 2008
Session 17: Special session - issues at the confluence of technology and design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Vivek Subramanian
Year: 2008
Technology-circuit collaboration for low-power LSI's
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Sakurai
Year: 2008
Design and use of tweakable devices for future logic implementation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Gupta
Year: 2008
Taking the next step in moore's law: Designs turn to enable next technology node
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.J. Strojwas
Year: 2008
Advanced simulation of statistical variability and reliability in nano CMOS transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Asenov; S. Roy; R.A. Brown; G. Roy; C. Alexander; C. Riddet; C. Millar; B. Cheng; A. Martinez; N. Seoane; D. Reid; M.F. Bukhori; X. Wang; U. Kovac
Year: 2008
Designing robust ultra-low power circuits
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Sylvester; S. Hanson; Mingoo Seok; Yu-Shiang Lin; D. Blaauw
Year: 2008
Designing smart temperature sensors in standard CMOS
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Makinwa
Year: 2008
Circuit-level requirements for MOSFET-replacement devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hei Kam; Tsu-Jae King-Liu; E. Alon; M. Horowitz
Year: 2008
Session 18: Characterization, reliability, and yield - Strain optimization and performance
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ramgopal Rao; Gilles Reimbold
Year: 2008
Strain mapping technique for performance improvement of strained MOSFETs with scanning transmission electron microscopy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Nakanishi; S. Kudo; M. Kawakami; T. Hayashi; H. Oda; T. Uchida; Y. Miyagawa; K. Asai; K. Ohnishi; N. Hattori; Y. Hirose; T. Koyama; K. Asayama; E. Murakami
Year: 2008
More strain and less stress- the guideline for developing high-end strained CMOS technologies with acceptable reliability
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S.S. Chung; E.R. Hsieh; D.C. Huang; C.S. Lai; C.H. Tsai; P.W. Liu; Y.H. Lin; C.T. Tsai; G.H. Ma; S.C. Chien; S.W. Sun
Year: 2008
Trimming of IC timing and delay by backside FIB processing - comparison of conventional and strained technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Schlangen; R. Leihkauf; T. Lundquist; P. Egger; U. Kerst; C. Boit
Year: 2008
A new framework for performance prediction of advanced MOSFETs with plasma-induced recess structure and latent defect site
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Eriguchi; Y. Nakakubo; A. Matsuda; M. Kamei; H. Ohta; H. Nakagawa; S. Hayashi; S. Noda; K. Ishikawa; M. Yoshimaru; K. Ono
Year: 2008
Effects of drain bias on threshold voltage fluctuation and its impact on circuit characteristics
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Miyamura; T. Nagumo; K. Takeuchi; K. Takeda; M. Hane
Year: 2008
Session 19: Quantum, power, and compound semiconductors devices - RF power and optoelectronic devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Enrico Zanoni; Vishnu Khemka
Year: 2008
High RF power transistor with laterally modulation-doped channel and self-aligned silicide in 45nm node CMOS technology
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Shima; T. Suzuki; Y. Kawano; K. Okabe; S. Yamaura; K. Joshin; T. Futatsugi
Year: 2008
A CMOS-compatible, high RF power, Asymmetric-LDD MOSFET with excellent linearity
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Chang; H.L. Kao; Y.J. Chen; S.L. Liu; S.P. McAlister; A. Chin
Year: 2008
Impact of electrical degradation on trapping characteristics of GaN high electron mobility transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jungwoo Joh; J.A. del Alamo
Year: 2008
Silicon photonic modulator and integration for high-speed applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Ling Liao; Ansheng Liu; J. Basak; H. Nguyen; M. Paniccia; Y. Chetrit; D. Rubin
Year: 2008
Observation of optical gain in ultra-thin silicon resonant cavity light-emitting diode
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Saito; N. Sakuma; Y. Suwa; H. Arimoto; D. Hisamoto; H. Uchiyama; J. Yamamoto; T. Sakamizu; T. Mine; S. Kimura; T. Sugawara; M. Aoki; T. Onai
Year: 2008
Role of non-radiative recombination in the degradation of InGaN-based laser diodes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Meneghini; N. Trivellin; L.-R. Trevisanello; K. Orita; M. Yuri; D. Ueda; E. Zanoni; G. Meneghesso
Year: 2008
Single-crystal thin-film bonding on diamond-like carbon film by intermolecular force for super high-density integration of high-power LEDs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Ogihara; T. Sagimori; M. Mutoh; H. Furuta; T. Suzuki; H. Fujiwara; M. Sakuta
Year: 2008
Session 20: Displays, sensors, and MEMS - biosensors and 3D hetero integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Werner Weber; Karlheinz Bock
Year: 2008
Precise detection of singly mismatched DNA with functionalized diamond electrolyte solution gate FET.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Kuga; S. Tajima; Jung-hoon Yang; K. Hirama; H. Kawarada
Year: 2008
Development of plasmonics-active SERS substrates on a wafer scale for chemical and biological sensing applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Dhawan; Yan Du; Hsinneng Wang; D. Leonard; V. Misra; M. Ozturk; M. Gerhold; T. Vo-Dinh
Year: 2008
Overcoming the screening-induced performance limits of nanowire biosensors: A simulation study on the effect of electro-diffusion flow
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Liu; K. Lilja; C. Heitzinger; R.W. Dutton
Year: 2008
Through-silicon via and die stacking technologies for microsystems-integration
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:E. Beyne; P. De Moor; W. Ruythooren; R. Labie; A. Jourdain; H. Tilmans; D.S. Tezcan; P. Soussan; B. Swinnen; R. Cartuyvels
Year: 2008
New heterogeneous multi-chip module integration technology using self-assembly method
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Fukushima; T. Konno; K. Kiyoyama; M. Murugesan; K. Sato; W.-C. Jeong; Y. Ohara; A. Noriki; S. Kanno; Y. Kaiho; H. Kino; K. Makita; R. Kobayashi; C.-K. Yin; K. Inamura; K.-W. Lee; J.-C. Bea; T. Tanaka; M. Koyanagi
Year: 2008
Session 21: Solid-state and nanoelectronic devices carbon-based devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Jing Kong; Tsu-Jae King Liu
Year: 2008
Mobility extraction and quantum capacitance impact in high performance graphene field-effect transistor devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Zhihong Chen; J. Appenzeller
Year: 2008
RF performance of top-gated, zero-bandgap graphene field-effect transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:I. Meric; N. Baklitskaya; P. Kim; K.L. Shepard
Year: 2008
Edge chemistry engineering of graphene nanoribbon transistors: A computational study
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yijian Ouyang; Youngki Yoon; Jing Guo
Year: 2008
High-frequency effects in carbon nanotube interconnects and implications for on-chip inductor design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Hong Li; K. Banerjee
Year: 2008
Scaling and variability analysis of CNT-based NEMS devices and circuits with implications for process design
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:H. Dadgour; A.M. Cassell; K. Banerjee
Year: 2008
Atomistic modeling of impurity ion implantation in ultra-thin-body Si devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Pelaz; R. Duffy; M. Aboy; L. Marques; P. Lopez; I. Santos; B.J. Pawlak; M. van Dal; B. Duriez; T. Merelle; G. Doornbos; N. Collaert; L. Witters; R. Rooyackers; W. Vandervorst; M. Jurczak; M. Kaiser; R. Weemaes; J. van Berkum; P. Breimer; R. Lander
Year: 2008
Atomistic modeling of fluorine implantation and diffusion in III-nitride semiconductors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Li Yuan; Maojun Wang; K.J. Chen
Year: 2008
Impact of platinum incorporation on thermal stability and interface resistance in NiSi/Si junctions based on first-principles calculation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:T. Marukame; T. Yamauchi; Y. Nishi; T. Sasaki; A. Kinoshita; J. Koga; K. Kato
Year: 2008
A new physics-based model for TANOS memories program/erase
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A. Mauri; C.M. Compagnoni; S. Amoroso; A. Maconi; F. Cattaneo; A. Benvenuti; A.S. Spinelli; A.L. Lacaita
Year: 2008
Oxide-based RRAM switching mechanism: A new ion-transport-recombination model
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B. Gao; S. Yu; N. Xu; L.F. Liu; B. Sun; X.Y. Liu; R.Q. Han; J.F. Kang; B. Yu; Y.Y. Wang
Year: 2008
Session 23: CMOS devices and technology - characteristics of mobility and threshold voltage in advanced devices
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Chih-Sheng Chang; Hyungcheol Shin
Year: 2008
Carrier transport and stress engineering in advanced nanoscale transistors from (100) and (110) transistors to carbon nanotube FETs and beyond
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Uchida; M. Saitoh; S. Kobayashi
Year: 2008
Comprehensive performance assessment of scaled (110) CMOSFETs based on understanding of STI stress effects and velocity saturation
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:M. Saitoh; N. Yasutake; Y. Nakabayashi; T. Numata; K. Uchida
Year: 2008
Comprehensive understanding of surface roughness and Coulomb scattering mobility in biaxially-strained Si MOSFETs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yi Zhao; M. Takenaka; S. Takagi
Year: 2008
Experimental and theoretical analysis of factors causing asymmetrical temperature dependence of Vt in High-k Metal gate CMOS with capped High-k techniques
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Iijima; M. Takayanagi
Year: 2008
On the difference of temperature dependence of metal gate and poly gate SOI MOSFET threshold voltages
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Shu-Jen Han; Xinlin Wang; P. Chang; Dechao Guo; Myung-Hee Na; Ken Rim
Year: 2008
Session 24: Special Evening Session highlights of ISSCC 2008
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Roland Thewes
Year: 2008
Session 26: Process technology - interconnect and 3D-IC technologies
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Toshiaki Hasegawa; Paul Kohl
Year: 2008
Enabling technologies for 3D integration: From packaging miniaturization to advanced stacked ICs
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Sillon; A. Astier; H. Boutry; L. Di Cioccio; D. Henry; P. Leduc
Year: 2008
A 300-mm wafer-level three-dimensional integration scheme using tungsten through-silicon via and hybrid Cu-adhesive bonding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Liu; R.R. Yu; A.M. Young; J.P. Doyle; X. Wang; L. Shi; K.-N. Chen; X. Li; D.A. Dipaola; D. Brown; C.T. Ryan; J.A. Hagan; K.H. Wong; M. Lu; X. Gu; N.R. Klymko; E.D. Perfecto; A.G. Merryman; K.A. Kelly; S. Purushothaman; S.J. Koester; R. Wisnieff; W. Haensch
Year: 2008
3D stacked IC demonstration using a through Silicon Via First approach
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Van Olmen; A. Mercha; G. Katti; C. Huyghebaert; J. Van Aelst; E. Seppala; Zhao Chao; S. Armini; J. Vaes; R.C. Teixeira; M. Van Cauwenberghe; P. Verdonck; K. Verhemeldonck; A. Jourdain; W. Ruythooren; M. de Potter de ten Broeck; A. Opdebeeck; T. Chiarella; B. Parvais; I. Debusschere; T.Y. Hoffmann; B. De Wachter; W. Dehaene; M. Stucchi; M. Rakowski; P. Soussan; R. Cartuyvels; E. Beyne; S. Biesemans; B. Swinnen
Year: 2008
High electromigration-resistant copper/carbon nanotube composite for interconnect application
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Yang Chai; P. Chan
Year: 2008
RF performance boosting for 40nm-node CMOS device by low-k/Cu dual damascene contact
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Kawahara; K. Hijioka; I. Kume; H. Nagase; A. Tanabe; M. Ueki; H. Yamamoto; F. Ito; N. Inoue; M. Tagami; N. Furutake; T. Onodera; S. Saito; T. Takeuchi; T. Fukai; M. Asada; K. Arita; K. Motoyama; A. Nakajima; E. Nakazawa; R. Kitao; K. Fujii; M. Sekine; M. Ikeda; Y. Hayashi
Year: 2008
Comprehensive study of 32 nm node ultralow-k/Cu (keff=2.6) dual damascene integration featuring short TAT silylated porous silica (k=2.1)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:N. Oda; S. Chikaki; T. Kubota; S. Nakao; K. Tomioka; E. Soda; N. Nakamura; J. Nogawa; Y. Kawashima; R. Hayashi; S. Saito
Year: 2008
Session 27: CMOS devices and technology - advanced CMOS logic and SoC platforms
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Seok-Hee Lee; Emmanuel Josse
Year: 2008
22 nm technology compatible fully functional 0.1 μm2 6T-SRAM cell
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:B.S. Haran; A. Kumar; L. Adam; J. Chang; V. Basker; S. Kanakasabapathy; D. Horak; S. Fan; J. Chen; J. Faltermeier; S. Seo; M. Burkhardt; S. Burns; S. Halle; S. Holmes; R. Johnson; E. McLellan; T.M. Levin; Y. Zhu; J. Kuss; A. Ebert; J. Cummings; D. Canaperi; S. Paparao; J. Arnold; T. Sparks; C.S. Koay; T. Kanarsky; S. Schmitz; K. Petrillo; R.H. Kim; J. Demarest; L.F. Edge; H. Jagannathan; M. Smalley; N. Berliner; K. Cheng; D. LaTulipe; C. Koburger; S. Mehta; M. Raymond; M. Colburn; T. Spooner; V. Paruchuri; W. Haensch; D. McHerron; B. Doris
Year: 2008
32nm gate-first high-k/metal-gate technology for high performance low power applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.H. Diaz; K. Goto; H.T. Huang; Yu. Yasuda; C.P. Tsao; T.T. Chu; W.T. Lu; V. Chang; Y.T. Hou; Y.S. Chao; P.F. Hsu; C.L. Chen; K.C. Lin; J.A. Ng; W.C. Yang; C.H. Chen; Y.H. Peng; C.J. Chen; C.C. Chen; M.H. Yu; L.Y. Yeh; K.S. You; K.S. Chen; K.B. Thei; C.H. Lee; S.H. Yang; J.Y. Cheng; K.T. Huang; J.J. Liaw; Y. Ku; S.M. Jang; H. Chuang; M.S. Liang
Year: 2008
32nm general purpose bulk CMOS technology for high performance applications at low voltage
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Arnaud; J. Liu; Y.M. Lee; K.Y. Lim; S. Kohler; J. Chen; B.K. Moon; C.W. Lai; M. Lipinski; L. Sang; F. Guarin; C. Hobbs; P. Ferreira; K. Ohuchi; J. Li; H. Zhuang; P. Mora; Q. Zhang; D.R. Nair; D.H. Lee; K.K. Chan; S. Satadru; S. Yang; J. Koshy; W. Hayter; M. Zaleski; D.V. Coolbaugh; H.W. Kim; Y.C. Ee; J. Sudijono; A. Thean; M. Sherony; S. Samavedam; M. Khare; C. Goldberg; A. Steegen
Year: 2008
A 45nm low power system-on-chip technology with dual gate (logic and I/O) high-k/metal gate strained silicon transistors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:C.-H. Jan; P. Bai; S. Biswas; M. Buehler; Z.-P. Chen; G. Curello; S. Gannavaram; W. Hafez; J. He; J. Hicks; U. Jalan; N. Lazo; J. Lin; N. Lindert; C. Litteken; M. Jones; M. Kang; K. Komeyli; A. Mezhiba; S. Naskar; S. Olson; J. Park; R. Parker; L. Pei; I. Post; N. Pradhan; C. Prasad; M. Prince; J. Rizk; G. Sacks; H. Tashiro; D. Towner; C. Tsai; Y. Wang; L. Yang; J.-Y. Yeh; J. Yip; K. Mistry
Year: 2008
A low power 40nm CMOS technology featuring extremely high density of logic (2100kGate/mm2) and SRAM (0.195μm2) for wide range of mobile applications with wireless system
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:R. Watanabe; A. Oishi; T. Sanuki; H. Kimijima; K. Okamoto; S. Fujita; H. Fukui; K. Yoshida; H. Otani; E. Morifuji; K. Kojima; M. Inohara; H. Igrashi; K. Honda; H. Yoshimura; T. Nakayama; S. Miyake; T. Hirai; T. Iwamoto; Y. Nakahara; K. Kinoshita; T. Morimoto; S. Kobayashi; S. Kyoh; M. Ikeda; K. Imai; M. Iwai; N. Nakamura; F. Matsuoka
Year: 2008
Gate length scaling and high drive currents enabled for high performance SOI technology using high-κ/metal gate
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:K. Henson; H. Bu; M.H. Na; Y. Liang; U. Kwon; S. Krishnan; J. Schaeffer; R. Jha; N. Moumen; R. Carter; C. DeWan; R. Donaton; D. Guo; M. Hargrove; W. He; R. Mo; R. Ramachandran; K. Ramani; K. Schonenberg; Y. Tsang; X. Wang; M. Gribelyuk; W. Yan; J. Shepard; E. Cartier; M. Frank; E. Harley; R. Arndt; R. Knarr; T. Bailey; B. Zhang; K. Wong; T. Graves-Abe; E. Luckowski; D.-G. Park; V. Narayanan; M. Chudzik; M. Khare
Year: 2008
Implementation and optimization of asymmetric transistors in advanced SOI CMOS technologies for high performance microprocessors
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Hoentschel; A. Wei; M. Wiatr; A. Gehring; T. Scheiper; R. Mulfinger; T. Feudel; T. Lingner; A. Poock; S. Muehle; C. Krueger; T. Herrmann; W. Klix; R. Stenzel; R. Stephan; P. Huebler; T. Kammler; P. Shi; M. Raab; D. Greenlaw; M. Horstmann
Year: 2008
A cost-conscious 32nm CMOS platform technology with advanced single exposure lithography and gate-first metal gate/high-k process
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Hasegawa; Y. Kitamura; K. Takahata; H. Okamoto; T. Hirai; K. Miyashita; T. Ishida; H. Aizawa; S. Aota; A. Azuma; T. Fukushima; H. Harakawa; E. Hasegawa; M. Inohara; S. Inumiya; T. Ishizuka; T. Iwamoto; N. Kariya; K. Kojima; T. Komukai; N. Matsunaga; S. Mimotogi; S. Muramatsu; K. Nagatomo; S. Nagahara; Y. Nakahara; K. Nakajima; K. Nakatsuka; M. Nishigoori; A. Nomachi; R. Ogawa; N. Okada; S. Okamoto; K. Okano; T. Oki; H. Onoda; T. Sasaki; M. Satake; T. Suzuki; Y. Suzuki; M. Tagami; K. Takeda; M. Tanaka; K. Taniguchi; M. Tominaga; G. Tsutsui; K. Utsumi; S. Watanabe; T. Watanabe; Y. Yoshimizu; T. Kitano; H. Naruse; Y. Goto; T. Nakayama; N. Nakamura; F. Matsuoka
Year: 2008
A 32nm logic technology featuring 2nd-generation high-k + metal-gate transistors, enhanced channel strain and 0.171μm2 SRAM cell size in a 291Mb array
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Natarajan; M. Armstrong; M. Bost; R. Brain; M. Brazier; C.-H. Chang; V. Chikarmane; M. Childs; H. Deshpande; K. Dev; G. Ding; T. Ghani; O. Golonzka; W. Han; J. He; R. Heussner; R. James; I. Jin; C. Kenyon; S. Klopcic; S.-H. Lee; M. Liu; S. Lodha; B. McFadden; A. Murthy; L. Neiberg; J. Neirynck; P. Packan; S. Pae; C. Parker; C. Pelto; L. Pipes; J. Sebastian; J. Seiple; B. Sell; S. Sivakumar; B. Song; K. Tone; T. Troeger; C. Weber; M. Yang; A. Yeoh; K. Zhang
Year: 2008
Session 28: Displays, sensors, and MEMS - MEMS actuators and resonators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Joost van Beek; Koichi Ikeda
Year: 2008
Highly reliable CMOS-integrated 11MPixel SiGe-based micro-mirror arrays for high-end industrial applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:L. Haspeslagh; J. De Coster; O.V. Pedreira; I. De Wolf; B. Du Bois; A. Verbist; R. Van Hoof; M. Willegems; S. Locorotondo; G. Bryce; J. Vaes; B. van Drieenhuizen; A. Witvrouw
Year: 2008
Multi-gate vibrating-body field effect transistor (VB-FETs)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:D. Grogg; M. Mazza; D. Tsamados; A.M. Ionescu
Year: 2008
A piezo-resistive resonant MEMS amplifier
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.T.M. van Beek; K.L. Phan; G.J.A.M. Verheijden; G.E.J. Koops; C. van der Avoort; J. van Wingerden; D.E. Badaroglu; J.J.M. Bontemps; R. Puers
Year: 2008
Exploring the limits and practicality of Q-based temperature compensation for silicon resonators
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J. Salvia; M. Messana; M. Ohline; M.A. Hopcroft; R. Melamud; S. Chandorkar; H.K. Lee; G. Bahl; B. Murmann; T.W. Kenny
Year: 2008
High piezoelectric properties in LiNbO3 transferred layer by the Smart Cut™ technology for ultra wide band BAW filter applications
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:J.-S. Moulet; M. Pijolat; J. Dechamp; F. Mazen; A. Tauzin; F. Rieutord; A. Reinhardt; E. Defay; C. Deguet; B. Ghyselen; L. Clavelier; M. Aid; S. Ballandras; C. Mazure
Year: 2008
Session 29: Modeling and simulation variability modeling and technology optimization
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:Gennady Gildenblatt; Wei-Kai Shih
Year: 2008
Rapid design flows for advanced technology pathfinding
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:P. Christie; A. Nackaerts; A. Kumar; A.S. Terechko; G. Doornbos
Year: 2008
A novel, rigorous approach to the dynamic, large-signal stability analysis of semiconductor devices and circuits under electro-thermal interaction
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:F. Cappelluti; F.L. Traversa; F. Bonani; G. Ghione
Year: 2008
Can the subthreshold swing in a classical FET be lowered below 60 mV/decade?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:S. Salahuddin; S. Datta
Year: 2008
Sub-20 nm gate length FinFET design: Can high-κ spacers make a difference?
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Authors:A.B. Sachid; R. Francis; M.S. Baghini; D.K. Sharma; K.-H. Bach; R. Mahnkopf; V.R. Rao
Year: 2008


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