IEC - International Electrotechnical Commission - IEC 60749-13:2002/COR1:2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 13 August 2003 |
| Status: | revised |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Modification of the validity date: now put at 2007.
Document History
February 15, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
IEC 60749-13:2002/COR1:2003
August 13, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Modification of the validity date: now put at 2007.
April 12, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all...