IEC - International Electrotechnical Commission - IEC 60749-13:2018

Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 15 February 2018
Status: published
Page Count: 28
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast... View More

Document History

IEC 60749-13:2018
February 15, 2018
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
IEC 60749-13:2018 describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast...
August 13, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Modification of the validity date: now put at 2007.
April 12, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 13: Salt atmosphere
Describes a salt atmosphere test that determines the resistance of semiconductor devices to corrosion. It is an accelerated test that simulates the effects of severe sea-coast atmosphere on all...
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