IEC - International Electrotechnical Commission - IEC 61163-1:2006
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 26 June 2006 |
| Status: | published |
| Page Count: | 161 |
| ICS Code (Quality in general): | 03.120.01 |
| ICS Code (Application of statistical methods): | 03.120.30 |
| ICS Code (Characteristics and design of machines, apparatus, equipment): | 21.020 |
abstract:
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an... View More
Document History
IEC 61163-1:2006
June 26, 2006
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an...
December 22, 1999
Corrigendum 1 - Reliability stress screening - Part 1: Repairable items manufactured in lots
A description is not available for this item.
August 14, 1995
Reliability stress screening - Part 1: Repairable items manufactured in lots
These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like...