IEC - International Electrotechnical Commission - IEC 61163-1:1995/COR1:1999

Corrigendum 1 - Reliability stress screening - Part 1: Repairable items manufactured in lots

revised
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Organization: IEC - International Electrotechnical Commission
Publication Date: 22 December 1999
Status: revised

Document History

June 26, 2006
Reliability stress screening - Part 1: Repairable assemblies manufactured in lots
This part of IEC 61163 describes particular methods to apply and optimize reliability stress screening processes for lots of repairable hardware assemblies, in cases where the assemblies have an...
IEC 61163-1:1995/COR1:1999
December 22, 1999
Corrigendum 1 - Reliability stress screening - Part 1: Repairable items manufactured in lots
A description is not available for this item.
August 14, 1995
Reliability stress screening - Part 1: Repairable items manufactured in lots
These processes are applicable for lots of repairable hardware items, in cases where the items have an unacceptably low reliability in the early failure period, and when other methods, like...
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