IEC - International Electrotechnical Commission - IEC 60749-17:2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
revised
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 20 February 2003 |
| Status: | revised |
| Page Count: | 11 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
Document History
March 28, 2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits...
IEC 60749-17:2003
February 20, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.