IEC - International Electrotechnical Commission - IEC 60749-17:2019

Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 28 March 2019
Status: published
Page Count: 17
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated... View More

Document History

IEC 60749-17:2019
March 28, 2019
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
IEC 60749-17:2019 is performed to determine the susceptibility of semiconductor devices to non-ionizing energy loss (NIEL) degradation. The test described herein is applicable to integrated circuits...
February 20, 2003
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
Used to determine the susceptibility of semiconductor devices to degradation in the neutron environment. Applicable to integrated circuits and discrete semiconductor devices.
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