IEC - International Electrotechnical Commission - IEC 60749-11:2002
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
published
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| Organization: | IEC - International Electrotechnical Commission |
| Publication Date: | 12 April 2002 |
| Status: | published |
| Page Count: | 13 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
abstract:
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that... View More
Document History
August 13, 2003
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Modification of the validity date: now put at 2007.
January 30, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
A description is not available for this item.
IEC 60749-11:2002
April 12, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that...