IEC - International Electrotechnical Commission - IEC 60749-11:2002/COR2:2003

Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method

published
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Organization: IEC - International Electrotechnical Commission
Publication Date: 13 August 2003
Status: published
ICS Code (Semiconductor devices in general): 31.080.01
abstract:

Modification of the validity date: now put at 2007.

Document History

IEC 60749-11:2002/COR2:2003
August 13, 2003
Corrigendum 2 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Modification of the validity date: now put at 2007.
January 30, 2003
Corrigendum 1 - Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
A description is not available for this item.
April 12, 2002
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Defines the rapid change of temperature test method and the two-fluid-bath method. This test method may also be used, employing fewer cycles, to test the effect of immersion in heated liquids that...
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